A new technical paper titled "Experimental Verification and Evaluation of Non-Stateful Logic Gates in Resistive RAM" was published by researchers at RWTH Aachen University and Forschungszentrum Jülich GmbH (FZJ).
Abstract
"Resistively switching, non-volatile memory devices facilitate new logic paradigms by combining storage and processing elements. Several non-stateful concepts such as Sco...
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