A new technical paper titled "An Experimental Analysis of RowHammer in HBM2 DRAM Chips" was published by researchers at ETH Zurich and American University of Beirut.
Abstract:
"RowHammer (RH) is a significant and worsening security, safety, and reliability issue of modern DRAM chips that can be exploited to break memory isolation. Therefore, it is important to understand real DRAM chips' ...
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