Shaping The Future Of Automotive Safety With V2X


In recent years, the automotive industry has witnessed a technological evolution that promises to redefine road safety and driving experiences. At the heart of this advancement is V2X technology, which stands for "vehicle-to-everything." This innovation allows vehicles to communicate with each other and their surroundings, enhancing road safety and efficiency. Understanding these cutting-edge d... » read more

Blog Review: Sept. 4


Synopsys' Jyotika Athavale and Randy Fish sit down with Google's Rama Govindaraju and Microsoft's Robert S. Chappell to discuss silent data corruption and why a solution will require chip designers and manufacturers, software and hardware engineers, vendors, and anyone involved in computer data to collaborate and take the issue seriously. Siemens' Karen Chow and Joel Mercier explain the rela... » read more

Blog Review: Aug. 28


Synopsys' Jon Ames checks out how the Ultra Ethernet Consortium aims to revolutionize networking by optimizing Ethernet for the rapidly evolving AI and HPC workloads by addressing critical issues like tail latency that are encountered by machine learning algorithms in large compute clusters. Cadence's Kos Gitchev introduces the DDR5 Multiplexed Rank DIMM (MRDIMM), a memory module technology ... » read more

Blog Review: Aug. 21


Cadence's Reela Samuel explores the critical role of PCIe 6.0 equalization in maintaining signal integrity and solutions to mitigate verification challenges, such as creating checkers to verify all symbols of TS0, ensuring the correct functioning of scrambling, and monitoring phase and LTSSM state transitions. Siemens' John McMillan introduces an advanced packaging flow for Intel's Embedded ... » read more

3.5D: The Great Compromise


The semiconductor industry is converging on 3.5D as the next best option in advanced packaging, a hybrid approach that includes stacking logic chiplets and bonding them separately to a substrate shared by other components. This assembly model satisfies the need for big increases in performance while sidestepping some of the thorniest issues in heterogeneous integration. It establishes a midd... » read more

Chip Industry Week In Review


The U.S. Department of Commerce and Texas Instruments (TI) signed a non-binding preliminary memorandum of terms to provide up to $1.6 billion in CHIPS Act funding towards TI’s investment of over $18 billion for three 300mm semiconductor wafer fabs under construction in Texas and Utah. TI also expects to get about $6 billion to $8 billion from the U.S. Department of Treasury’s Investmen... » read more

Blog Review: Aug. 14


Cadence's Dimitry Pavlovsky highlights two new features in the AMBA CHI protocol Issue G update that enhance security of the Arm architecture: Memory Encryption Contexts, which allows data in each Realm in the memory to be encrypted with a different encryption key, and Device Assignment, which introduces hardware provisions to support fully coherent caches in partially trusted remote coherent d... » read more

CPU Performance Bottlenecks Limit Parallel Processing Speedups


Multi-core processors theoretically can run many threads of code in parallel, but some categories of operation currently bog down attempts to raise overall performance by parallelizing computing. Is it time to have accelerators for running highly parallel code? Standard processors have many CPUs, so it follows that cache coherency and synchronization can involve thousands of cycles of low-le... » read more

Chip Industry Week In Review


Three Fraunhofer Institutes (IIS/EAS, IZM, and ENAS) launched the Chiplet Center of Excellence, a research initiative to support the commercial introduction of chiplet technology. The center initially will focus on automotive electronics, developing workflows and methods for electronics design, demonstrator construction, and the evaluation of reliability. The UCIe Consortium published the Un... » read more

Challenges And Outlook Of ATE Testing For 2nm SoCs


The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of testing and ensuring manufacturability increases exponentially. 3nm silicon is a mastered art now, with yields hitting pretty high for even complex packaged silicon, while the transition from 3nm to... » read more

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