tag: coverage

Rediscovering Coverage Insurance
By Dave Kelf - 27 Apr, 2017 - Comments: 0

When coverage comes up in conversation, if it comes up at all, it’s always a matter of car, home or health insurance. Coverage and functional verification are unlikely to be used in that discussion, or any other for that matter. That’s too bad because engineering groups grapple with when is enough verification enough, like some kind of coverage insurance. Oh sure, simulation and emulatio... » read more

Fault Simulation Reborn
By Brian Bailey - 23 Feb, 2017 - Comments: 0

Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the quality of manufacturing test vectors. That task was replaced almost entirely by [getkc id="173" comment="scan test"] and automatic test pattern generation (ATPG). Today, functional safety is cau... » read more

Confidence In 7nm Designs Requires Multi-Variable, Multi-Scenario Analysis
By Sankar Ramachandran - 09 Feb, 2017 - Comments: 0

As designs move toward 7-nanometer (nm) process nodes, engineering and production cost dramatically increases and the stake in getting the design right the first time becomes significantly higher than ever before. You are faced with the question, “how confident are you in your design analysis coverage?” Tighter noise margin, increasing power density, faster switching current and greater ... » read more

Formal’s Roadmap
By Brian Bailey - 12 Dec, 2016 - Comments: 0

Formal verification has come a long way in the past five years as it focused on narrow tasks within the verification flow. Semiconductor Engineering sat down to discuss that progress, and the future of formal technologies, with [getperson id="11306" comment="Raik Brinkmann"], president and CEO of [getentity id="22395" e_name="OneSpin Solutions"]; Harry Foster, chief verification scientist at [g... » read more

Tech Talk: Power Signoff
By Ed Sperling - 08 Sep, 2016 - Comments: 0

Ansys' Aveek Sarkar the challenges of power signoff at advanced process nodes, the impact of over-design, and what's necessary for sufficient coverage. [youtube vid=VQoT2KYW-AM] » read more

Accelerate Time To Market With Change Impact Testing
By Synopsys - 07 Sep, 2016 - Comments: 0

QA teams don’t have time to test everything yet they can’t afford to ship buggy code. Teams waste precious resources on tests that have no relevance to the changes that were made to the application. And worse, there may be holes in the testing coverage which could lead to regression risk. Learn how Coverity can help organizations shrink their testing cycles and reduce regression risk by foc... » read more

Gaps Emerge In Test Flows
By Ed Sperling - 04 Aug, 2016 - Comments: 0

Gaps are showing up in test flows as chipmakers add more analog content and push into more safety-critical applications, exposing more points at which designs need to be tested as well as weaknesses in current tools and methodologies. The cornerstone of the [getkc id="76" kc_name="IoT"], and connected devices such as self-driving cars, is a heavy reliance on [getkc id="187" kc_name="sensors"... » read more

Can Verification Meet In The Middle?
By Brian Bailey - 30 Jun, 2016 - Comments: 0

Since the dawn of time for the EDA industry, the classic V diagram has defined the primary design flow. On the left hand side of the V, the design is progressively refined and partitioned into smaller pieces. At the bottom of the V, verification takes over and as you travel up the right-hand side of the V, verification and integration happens until the entire design has been assembled and valid... » read more

System-Level Verification Tackles New Role
By Brian Bailey - 15 Jun, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss advances in system-level verification with Larry Melling, product management director for the system verification group of [getentity id="22032" e_name="Cadence"]; Larry Lapides, vice president of sales for [getentity id="22036" e_name="Imperas”] and Jean-Marie Brunet, director of marketing for the emulation division of [getentity id="22017" e_nam... » read more

Formal Confusion
By Brian Bailey - 07 Jun, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss the right and wrong ways to apply formal verification technology with Normando Montecillo, associate technical director at [getentity id="22649" comment="Broadcom"]; Ashish Darbari, principal engineer at [getentity id="22709" e_name="Imagination Technologies"]; Roger Sabbagh, principal engineer at Huawei; and Stuart Hoad, lead engineer at PMC Sierra... » read more

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