tag: test

In-System/In-Field Testing Using High-Quality Deterministic Test Patterns
By Ashrith Harith - 10 Jun, 2025 - Comments: 0

The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with stringent safety standards, will further increase the number of electronic components required. Testing efforts must be of exceptional quality. The target test time is often limited to less than 1... » read more

The Challenges Of Testing Automotive Chips
By Pawini Mahajan - 10 Jun, 2025 - Comments: 0

For as long as semiconductor devices have been around, motor vehicles have been one of the toughest operating environments. Chips in automobiles, trucks, and buses are subject to extremes of temperature, humidity, vibration, and radiation. The challenges of designing for these environmental conditions have grown more pronounced with advanced technology nodes, which are necessary to satisfy mark... » read more

The Data Dilemma In Semiconductor Testing And Why It Matters: Part 1
By Robert Colecchia - 10 Jun, 2025 - Comments: 0

In today’s semiconductor industry, machine learning (ML) is no longer a buzzword — it’s an operational necessity. From optimizing test flows to identifying device drifts and executing advanced analytics like VMIN or trimming, ML-based applications are increasingly used to boost yields, improve quality, and lower test costs. But there’s a catch. To make these intelligent applications ... » read more

High-Speed Test IO: Addressing High-Performance Data Transmission And Testing Needs For HPC & AI
By Lakshmi Jain - 15 May, 2025 - Comments: 0

By Lakshmi Jain and Wei-Yu Ma The AI and HPC industries are rapidly shifting toward chiplet-based designs to achieve unprecedented levels of performance, as traditional monolithic system-on-chip (SoC) architectures face scaling limitations. This transition is fueled by the rise of heterogeneous integration, which is driving innovation across the semiconductor sector. However, this advancemen... » read more

Development Flows For Chiplets
By Brian Bailey - 15 May, 2025 - Comments: 2

Chiplets offer a huge leap in semiconductor functionality and productivity, just like soft IP did 40 years ago, but a lot has to come together before that becomes reality. It takes an ecosystem, which is currently very rudimentary. Today, many companies have hit the reticle limit and are forced to move to multi-die solutions, but that does not create a plug-and-play chiplet market. These ear... » read more

AI For Test: The New Frontier
By Christophe Begue - 08 May, 2025 - Comments: 0

Dr. Ming Zhang, PDF Solutions vice president of Fabless Solutions, delivered the keynote at the TestConX 2025 conference in March. As he began his presentation, Ming borrowed the “learn, explore and share” line from Ira Feldman, the organizer of the conference, to set the tone of his talk. He promised to share what he and PDF Solutions learned and what’s useful and what’s not useful as ... » read more

Coaxial Test Sockets Are In The Critical Path Of Advanced AI/CPU Products
By Jack Lewis - 08 May, 2025 - Comments: 0

Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and advanced packaging manufacturing process. Yield loss at this point in the process is catastrophic to the bottom line. We at Modus Test, working in conjunction with our customers, have seen first-h... » read more

Overview Of Printed And Flexible Electronics: Technology Fundamentals, Design And Practical Applications
By Technical Paper Link - 07 May, 2025 - Comments: 0

A new technical paper titled "Computing with Printed and Flexible Electronics" was published by researchers at Karlsruhe Institute of Technology, Pragmatic Semiconductor Ltd and University of Patras. Abstract "Printed and flexible electronics (PFE) have emerged as the ubiquitous solution for application domains at the extreme edge, where the demands for low manufacturing and operational cos... » read more

Nearly Invisible: Defect Detection Below 5nm
By Gregory Haley - 08 Apr, 2025 - Comments: 0

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, defects are often hidden beneath intricate device structures and packaging schemes. Moreover, traditional optical and electrical probing methods, trusted for decades, are proving inadequate against ... » read more

Unlocking The Value Of Yield
By Marc Hutner - 11 Mar, 2025 - Comments: 0

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once the goals are achieved, or should you find ways to drive additional value into your organization once production has begun? What is the value of a 1% improvement in product yield? The short answer ... » read more

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