Best Practices For Saving Measurement Data


You collect data to make decisions. However, an inefficient file format may cause problems when analyzing your data. The key to choosing a file format for your application involves thinking about the current system requirements and how the file can adapt for future application needs. To help you organize your file format for your application, use the guide and checklist of questions: • Ho... » read more

Meeting ISO 26262 Requirements Using Tessent IC Test Solutions


As the industry moves towards greater automation in vehicles, suppliers of the ICs used to drive the automotive electronic systems are rapidly adopting solutions to meet ISO 26262 requirements. The Tessent family of IC test products offers the highest defect coverage, in-system non-destructive memory test, hybrid ATPG/Logic BIST, and analog test coverage measurement. These technologies add up t... » read more

Gaps Emerge In Automotive Test


Demands by automakers for zero defects over 18 years are colliding with real-world limitations of testing complex circuitry and interactions, and they are exposing a fundamental disconnect between mechanical and electronic expectations that could be very expensive to fix. This is especially apparent at leading-edge nodes, where much of the logic is being developed for AI systems and image se... » read more

Modernizing Test In Aerospace And Defense


These days, you can’t attend a conference or have a conversation with leaders of the aerospace and defense community without touching on the modernization of the sector. This includes the integration of new technologies and processes to address aging equipment and fleets. The scale of the challenges in this space is too large, the costs are too high, and the impact of failure is too great to ... » read more

Making AI More Dependable


Ira Leventhal, vice president of Advantest’s new concept product initiative, looks at why AI has taken so long to get going, what role it will play in improving the reliability of all chips, and how to use AI to improve the reliability of AI chips themselves. » read more

Automotive, AI Drive Big Changes In Test


Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

Redefining Expectations for Test


New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

AI Chip DFT Techniques For Aggressive Time-To-Market


AI chips have aggressive time-to-market goals. Designers can shave significant time off of DFT and silicon bring up using the techniques described in this paper. Leading AI semiconductor companies have already had success with Tessent DFT tools. To read more, click here. » read more

Own Test Architecture To Meet Ever-Growing Test Coverage


Automotive consumers worldwide are increasingly basing their purchase decisions on the vehicle’s user interface, or human-machine interface (HMI). An in-vehicle infotainment (IVI) or car multimedia system, together with a digital cockpit, heavily influences how drivers and passengers feel about vehicles. And while HMI-related automotive electronics account for 70 percent of all in-car code, e... » read more

Redefining Expectations For Test


New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

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