tag: chip aging

A Test Generation Procedure Targeting Subcircuits With High Susceptibilities To Aging (Purdue University)
By Technical Paper Link - 13 Feb, 2026 - Comments: 0

A technical paper titled "Test Generation for Subcircuits with High Functional Switching Activities" was published by Irith Pomeranz at Purdue University. Abstract "Chip aging results in defects that are initially likely to appear as delay faults. The susceptibility of a delay fault to aging can be assessed based on the layout or the functional workload at the fault site. The key contribu... » read more

Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)
By Technical Paper Link - 08 Jan, 2026 - Comments: 0

A new technical paper titled "Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set" was published by researchers at Purdue University. Abstract "Chip aging may result in hardware defects whose likelihood of occurrence depends on the layout and functional workload at the defect site. In-field testing is important for the detection of defects that occur... » read more

Improving IC System Quality And Performance
By Ed Sperling - 12 Nov, 2025 - Comments: 0

Ensuring that multi-die assemblies and advanced SoCs will work as expected from time zero to the end of their lifecycle adds new challenges for chipmakers and their customers. Chips are being run harder, hotter, and for longer periods of time, often in unique configurations and with customized workloads. Alex Burlak, vice president of test and analytics at proteanTecs, talks about how to identi... » read more

Strain, Stress In Advanced Packages Drives New Design Approaches
By Ann Mutschler - 19 Dec, 2024 - Comments: 2

Thermal and mechanical stresses are creating significant challenges in heterogeneous chiplet assemblies, increasing the time and cost required to work through all the possible physical effects, dependencies, and interactions, and driving demand for new tools. Unlike in the past, when various components were crammed into a planar SoC on a relatively thick substrate, the new substrates are bei... » read more

Auto Chip Aging Accelerates In Hot Climates
By Ed Sperling - 09 Dec, 2024 - Comments: 1

Automotive chips are aging significantly faster than expected in hot climates with sustained high temperatures, raising concerns about the reliability of electrified vehicles over time and whether advanced-node chips are the right choice for safety-critical applications. Many of the most advanced electronics used in vehicles today are ASIL D-compliant, expected to function up to 125° C. But... » read more

How Big A Deal Is Aging?
By Brian Bailey - 17 Oct, 2024 - Comments: 0

Nothing lasts forever, but in the semiconductor world things used to last long enough to become obsolete long before their end of life. That's no longer the case with newer nodes, and it is raising concerns in safety-critical markets such as automotive. Being able to fully understand what happens inside of chips is still a work in progress, and analysis approaches are trying to keep up. Unti... » read more

Chip Aging Becoming Key Factor In Data Center Economics
By Ann Mutschler - 20 May, 2024 - Comments: 1

Chip aging is becoming a much bigger concern inside of data centers, where it can impact server uptime, utilization rates, and the amount of energy needed to drive signals and cool entire server racks. Aging in chips is the result of both higher logic utilization and increasing transistor density. This is problematic for data centers, in general, but especially for AI chips where digital log... » read more

NBTI & PBTI of MOSFETs
By Technical Paper Link - 30 May, 2022 - Comments: 0

Technical paper titled "Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction" from researchers at Liverpool John Moores University. Abstract "CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This r... » read more

New Challenges For Connected Vehicles
By John Koon - 11 Apr, 2022 - Comments: 0

Connected vehicles are all about convenience and safety. Modern vehicles are connected to the Internet via wireless networks, consumer apps, and infotainment systems, and there is work underway to connect them over 5G to guided driving. But there also are challenges to making all of this work securely, safely, and as expected throughout the expected lifetimes of chips and systems. The goal i... » read more

Making Chips To Last Their Expected Lifetimes
By Ed Sperling - 21 Oct, 2020 - Comments: 2

Chips are supposed to last their lifetime, but that expectation varies greatly depending upon the end market, whether the device is used for safety- or mission-critical applications, and even whether it can be easily replaced or remotely fixed. It also depends on how those chips are used, whether they are an essential part of a complex system, and whether the cost of continual monitoring and... » read more

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