NBTI & PBTI of MOSFETs


Technical paper titled "Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction" from researchers at Liverpool John Moores University. Abstract "CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This r... » read more

New Challenges For Connected Vehicles


Connected vehicles are all about convenience and safety. Modern vehicles are connected to the Internet via wireless networks, consumer apps, and infotainment systems, and there is work underway to connect them over 5G to guided driving. But there also are challenges to making all of this work securely, safely, and as expected throughout the expected lifetimes of chips and systems. The goal i... » read more

Making Chips To Last Their Expected Lifetimes


Chips are supposed to last their lifetime, but that expectation varies greatly depending upon the end market, whether the device is used for safety- or mission-critical applications, and even whether it can be easily replaced or remotely fixed. It also depends on how those chips are used, whether they are an essential part of a complex system, and whether the cost of continual monitoring and... » read more

Maximizing Value Post-Moore’s Law


When Moore's Law was in full swing, almost every market segment considered moving to the next available node as a primary way to maximize value. But today, each major market segment is looking at different strategies that are more closely aligned with its individual needs. This diversity will end up causing both pain and opportunities in the supply chain. Chip developers must do more with a ... » read more

Circuit Aging Becoming A Critical Consideration


Circuit aging was considered somebody else's problem when most designs were for chips in consumer applications, but not anymore. Much of this reflects a shift in markets. When most chips were designed for consumer electronics, such as smart phones, designs typically were replaced every couple of years. But with the mobile phone market flattening, and as chips increasingly are used in automot... » read more

Top Stories For 2018


Each year, I look back to see what articles people like to read. The first thing that has amazed me each year at Semiconductor Engineering is that what should be a strong bias towards articles published early in the year never seems to play out. The same is true this year. More than half of the top articles were published after July. The second thing that remains constant is that people love... » read more

Minimizing Chip Aging Effects


Aging kills semiconductors, and it is a growing problem for an increasing number of semiconductor applications—especially as they migrate to more advanced nodes. Additional analysis and prevention methods are becoming necessary for safety critical applications. While some aspects of aging can be mitigated up front, others are tied to the operation of the device. What can an engineering tea... » read more

Aging Models: The Basis For Predicting Circuit Reliability


Today, many products are based on high-performance electronic systems and integrated circuits (ICs), and the importance of these elements is ever-increasing. A certain tension arises here as these applications often call for a large amount of processing power and reliability. The processing power can best be supplied with highly scaled semiconductor technologies. However, these manufacturing te... » read more

Understanding Your Chip’s Age


A Q&A with Moortec CTO Oliver King. Why is understanding your chip's age important? Semiconductor devices age over time, we all know that, but what is often not well understood are the mechanisms for aging or the limits that will cause a chip to fail. In addition, there is bound to be a requirement for a minimum lifetime of a device which will depend on application but could be two or... » read more