Sensor Fusion Challenges In Cars


The automotive industry is zeroing in on sensor fusion as the best option for dealing with the complexity and reliability needed for increasingly autonomous vehicles, setting the stage for yet another shift in how data from multiple devices is managed and utilized inside a vehicle. The move toward greater autonomy has proved significantly more complicated than anyone expected at first. There... » read more

Security At The Edge


Semiconductor Engineering sat down to discuss security at the edge with Steven Woo, vice president of enterprise solutions technology and distinguished inventor at Rambus, Kris Ardis, executive director at Maxim Integrated; and Steve Roddy, vice president of Arm's Products Learning Group. What follows are excerpts of that conversation. To view part one of this discussion, click here. Part two i... » read more

Custom Designs, Custom Problems


Semiconductor Engineering sat down to discuss power optimization with Oliver King, CTO at Moortec; João Geada, chief technologist at Ansys; Dino Toffolon, senior vice president of engineering at Synopsys; Bryan Bowyer, director of engineering at Mentor, a Siemens Business; Kiran Burli, senior director of marketing for Arm's Physical Design Group; Kam Kittrell, senior product management group d... » read more

Chip Design Is Getting Squishy


So many variables, uncertainties and new approaches are in play today across the chip industry today that previous rules are looking rather dated. In the past, a handful of large companies or organizations set the rules for the industry and established an industry roadmap. No such roadmap exists today. And while there are efforts underway to create new roadmaps for different industries, inte... » read more

Reliability In Automotive Chips


Roland Jancke, head of department for design methodology at Fraunhofer IIS’ Engineering of Adaptive Systems Division, looks at how to ensure that chips used in cars are reliable over extended periods of use, how mission profiles vary depending upon where they are used, and why it’s important to understand what chips developed at the latest nodes can really be used for and how they will be ... » read more

Ensuring Functional Safety In Design


Mohammed Abdelwahid (Ali), automotive logic test product manager at Mentor, a Siemens Business, discusses how to maximize coverage in the different ASIL standards for logic BiST, how to make testing more efficient, and what impact that has on area and test time. » read more

How Chips Age


Andre Lange, group manager for quality and reliability at Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about circuit aging, whether current methods of predicting reliability are accurate for chips developed at advanced process nodes, and where additional research is needed. » read more

Using Static Analysis For Functional Safety


Fadi Maamari, group director for R&D at Synopsys, explains why static analysis is suddenly in demand in auto chip design, how it can help to choose the best implementation of functional safety approaches, and where it fits into the design flow. » read more

Circuit Aging Becoming A Critical Consideration


Circuit aging was considered somebody else's problem when most designs were for chips in consumer applications, but not anymore. Much of this reflects a shift in markets. When most chips were designed for consumer electronics, such as smart phones, designs typically were replaced every couple of years. But with the mobile phone market flattening, and as chips increasingly are used in automot... » read more

The Power Of De-Integration


The idea that more functionality can be added into a single chip, or even into a single system, is falling out of vogue. For an increasing number of applications, it's no longer considered the best option for boosting performance or lowering power, and it costs too much. Hooman Moshar, vice president of engineering at Broadcom, said in a keynote speech at Mentor's User2User conference this w... » read more