tag: computer vision

Operator Shortage? Intelligent Machine Vision Can Give More And Better Wafer Inspection
By Errol Akomer - 20 Nov, 2025 - Comments: 0

Right now, wafer manufacturers are having serious problems in finding and retaining operators. And they're desperately looking for ways to keep their fabs running effectively. Fortunately, machine vision can offer a smart solution. To see how it works, let’s first look at the basic fab workflow and check out some opportunities for improvement… How to improve ADI In a typical fab, after... » read more

Classical Computing vs. Machine Learning and Edge AI Techniques in Various Application Domains
By Infineon - 06 Nov, 2025 - Comments: 0

Machine Learning (ML) algorithms have revolutionized various domains by enabling data-driven decision-making and automation. The deployment of ML models on embedded edge devices, characterized by their constrained computational resources and low power requirements, presents unique challenges and opportunities. As the digital world continues to generate increasingly complex and high-volume da... » read more

Time-of-Flight Decoding Enhanced By Tensilica Vision DSPs
By Cadence - 13 Aug, 2025 - Comments: 0

Time-of-Flight (ToF) technology has become a vital tool for precise depth perception in computer vision, driving innovation across diverse applications such as autonomous systems and medical equipment. Efficient processing of ToF data is paramount for realizing this technology’s full potential. This document highlights how Cadence's Tensilica Vision DSP architecture is significantly adv... » read more

Research Bits: June 24
By Jesse Allen - 24 Jun, 2025 - Comments: 0

In-sensor visual processing Researchers from the University of Massachusetts Amherst created silicon-based in-sensor visual processing arrays that can both capture and process visual data in the analog domain to reduce the latency between sensing and identification. The team created two integrated arrays of gate-tunable silicon photodetectors that share bipolar analog output and low-power o... » read more

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)
By Technical Paper Link - 21 Jun, 2025 - Comments: 0

A new technical paper titled "Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing" was published by researchers at Infineon Technologies, University of Padova and University of Bologna. Abstract "In the semiconductor sector, due to high demand but also strong and increasing competition, time to market and quality are key factors in securing significant marke... » read more

Building Vision-Enabled Devices To Capture The Emerging Wave In IoT
By Diya Soubra - 13 Feb, 2025 - Comments: 0

The evolution of vision (the eye) is considered one of the most significant events in the history of life on Earth. 540 million years ago, during the Cambrian period, there was a sudden burst of evolutionary activity that resulted in the appearance of a variety of new species. Many of these species were characterized by the development of an eye which allowed them to perceive and interact with ... » read more

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)
By Technical Paper Link - 22 Oct, 2024 - Comments: 0

A new technical paper titled "Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review" was published by researchers at KU Leuven and imec. Abstract: "In this review, automatic defect inspection algorithms that analyze Electron Microscope (EM) images of Semiconductor Manufacturing (SM) products are identified, categorized, and discussed. Thi... » read more

Fundamental Issues In Computer Vision Still Unresolved
By Karen Heyman - 02 May, 2024 - Comments: 1

Given computer vision’s place as the cornerstone of an increasing number of applications from ADAS to medical diagnosis and robotics, it is critical that its weak points be mitigated, such as the ability to identify corner cases or if algorithms are trained on shallow datasets. While well-known bloopers are often the result of human decisions, there are also fundamental technical issues that ... » read more

The Power of Memory in Camera Monitor Systems
By Winbond - 03 Apr, 2024 - Comments: 0

According to the World Health Organization, approximately 1.19 million people die each year as a result of road traffic crashes. The challenge automakers have is deciding what types of cameras or sensors to implement to help prevent accidents, and making sure they meet various regulations. Camera monitoring systems or (CMS) represent a significant milestone in the ongoing evolution of automo... » read more

How To Build Computer Vision Solutions
By Arm - 14 Feb, 2024 - Comments: 0

Computer vision devices that can ‘see’ and act on visual information are bringing new efficiencies and functionalities to IoT. But with new opportunities come complexities. The specific features and functionality of smart vision use cases vary widely. Creating a system that catches defects on an assembly line requires different imaging, machine learning, and workloads compared to one ... » read more

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