Novel Methods To Enhance Data Quality in FMEA Documents In Semiconductor Manufacturing

New research paper from Graz University of Technology & others. Abstract "Digitalization of causal domain knowledge is crucial. Especially since the inclusion of causal domain knowledge in the data analysis processes helps to avoid biased results. To extract such knowledge, the Failure Mode Effect Analysis (FMEA) documents represent a valuable data source. Originally, FMEA documents were de... » read more