Monitoring IC Abnormalities Before Failures


The rising complexities of semiconductor processes and design are driving an increasing use of on-chip monitors to support data analytics from an IC’s birth through its end of life — no matter how long that projected lifespan. Engineers have long used on-chip circuitry to assist with manufacturing test, silicon debug and failure analysis. Providing visibility and controllability of inter... » read more

Data Becomes Key For Next-Gen Chips


Data has become vital to understanding the useful life of a semiconductor — and the knowledge gleaned is key to staying competitive beyond Moore’s Law. What's changed is a growing reliance earlier in the design cycle on multiple sources of data, including some from further right in the design-through-manufacturing flow. While this holistic approach may seem logical enough, the semiconduc... » read more

Data Will Swamp The Internet, Unless We Think Differently


To harvest the IoT device and data opportunity in the coming years, companies must rethink their infrastructure strategy. This means re-imagining computing from the edge to the cloud. Download this report to see how leading teams are transforming their infrastructure strategies today to win tomorrow. Click here to read more. » read more

Liability And Reliability


As systems vendors accelerate the development of their own architectures, semiconductor companies across the supply chain are getting a seat at the table for architecting the engines in those systems. Rather than competing for a socket, they are directly involved in strategizing the optimal solution that can make a systems vendor or OEM more competitive or far more efficient. That gives the dev... » read more

Using Fab Sensors To Reduce Auto Defects


The semiconductor manufacturing ecosystem has begun collaborating on ways to effectively use wafer data to meet the stringent quality and reliability requirements for automotive ICs. Silicon manufacturing companies are now leveraging equipment and inspection monitors to proactively identify impactful defects prior to electrical test. Using machine learning techniques, they combine the monitor ... » read more

Cleaning Data For Final Test


John O’Donnell, CEO of yieldHUB, talks about why data integrity is so critical for final test, what can cause it to be less-than-perfect, what’s needed to improve the quality of that data, and how that impacts the overall yield in a fab. » read more

Sensing Automotive IC Failures


The sooner you detect a failure in any electronic system, the sooner you can act. Together, data analytics and on-chip sensors are poised to boost quality in auto chips and add a growing level of predictive maintenance for vehicles. The ballooning number of chips cars makes it difficult to reach 10 defective parts per billion for every IC that goes into a car.  And requiring that for a 15-y... » read more

The Need For Traceability In Auto Chips


Someday your car will drive itself to a repair shop for a recall using a scheduling application that is both efficient and can prioritize which vehicles need to be fixed first. But that's still a ways off. Proactive identification of issues is not yet available. To be ready for that, today’s data analytics systems need to begin supporting targeted recalls, enabling predictive maintenance a... » read more

PCIe 5.0 Drill-Down


Suresh Andani, senior director of product marketing for SerDes IP at Rambus, digs into the new PCI Express standard, why it’s so important for data centers, how it compares with previous versions of the standard, and how it will fit into existing and non-von Neumann architectures. » read more

Designing Resilient Electronics


Electronic systems in automobiles, airplanes and other industrial applications are becoming increasingly sophisticated and complex, required to perform an expanding list of functions while also becoming smaller and lighter. As a result, pressure is growing to design extremely high-performance chips with lower energy consumption and less sensitivity to harsh environmental conditions. If this ... » read more

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