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What Designers Need to Know About Error Correction Code (ECC) In DDR Memories


As with any electronic system, errors in the memory subsystem are possible due to design failures/defects or electrical noise in any one of the components. These errors are classified as either hard-errors (caused by design failures) or soft-errors (caused by system noise or memory array bit flips due to alpha particles, etc.). To handle these memory errors during runtime, the memory subsyst... » read more

Taming Novel NVM Non-Determinism


New memory technologies may have non-deterministic characteristics that add calibration to the test burden — and may require recalibration during their lifetime. Many of these memories are in development as a result of the search for a storage-class memory (SCM) technology that can bridge the gap between larger, slower memories like flash and faster DRAM memory. There are several approache... » read more