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4 Issues In Test


When most design engineers think about test, they envision a large piece of equipment in the fab they probably will never actually see or interact with. But as chips become more complex—driven by an explosion in both quantity and different types of data—test is emerging as one of the big challenges in design and manufacturing. There are four primary segments for test, each with its own s... » read more

The Race To Zero Defects


By Jeff Dorsch and Ed Sperling Testing chips is becoming more difficult, more time-consuming, and much more critical—particularly as these chips end up in cars, industrial automation, and a variety of edge devices. Now the question is how to provide enough test coverage to ensure that chips will work as expected without slowing down the manufacturing process or driving up costs. Balanci... » read more