Streamlining Failure Analysis Of Chips


Experts at the Table: Semiconductor Engineering sat down to discuss how increasing complexity in semiconductor and packaging technology is driving shifts in failure analysis methods, with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; Mike McIntyre, director of product management in the Enterprise Business Unit at Onto Innovation; Kamran Hak... » read more

An Open-Source Solution To Accelerate Autonomous Vehicle Validation And Verification Research


A technical paper titled “PolyVerif: An Open-Source Environment for Autonomous Vehicle Validation and Verification Research Acceleration” was published by researchers at Florida Polytechnic University, Embry-Riddle Aeronautical University, Tallinn University of Technology, and Acclivis Technologies. Abstract: "Validation and Verification (V&V) of Artificial Intelligence (AI) based cyb... » read more