A Tale of Two Testers


David Tacelli, president and CEO of Xcerra, was excited. His company’s reception for customers (and the press) at the Trou Normand restaurant in San Francisco’s hip South of Market neighborhood was going very well. Gourmet salames and other tasty foods were on offer, along with fine wines and craft ales and beers. He gleefully pointed out to editors that the product to be introduced at t... » read more

Test at “West”


As you wander through the North Hall of Moscone Center this week, you may notice that some of the big names in automated test equipment are not on the SEMICON West show floor this year. Advantest America has a booth, but the same cannot be said of Teradyne or Xcerra. Some of the bigger names in test and measurement instruments won’t be found exhibiting at SEMICON West, either – such as Keys... » read more

The Future of Testing


In our previous test blog posts, we looked at the history of automated test equipment for semiconductors and for printed circuit boards. This month, we look ahead to the test technologies that are emerging. The chip ATE field has essentially boiled down to Advantest, Teradyne, and Xcerra (LTX-Credence), while the board test market is dominated by Teradyne and Keysight Technologies (formerly ... » read more

A Brief History of Test


The history of semiconductor test systems is the subject of this blog post. We’ll turn to printed circuit board testing at another time. Boston-based Teradyne sold its D133 diode tester to Raytheon in 1961. Five years later, it introduced the J259 integrated circuit tester, which had a minicomputer to run the test programs. For many, this marks the beginning of automatic (or automated) tes... » read more

The Week In Review: Manufacturing


About 150 to 200 employees from IBM’s chip unit will be dispatched to work at GlobalFoundries, according to the Poughkeepsie Journal. GlobalFoundries said the arrangement is temporary, according to the report. GlobalFoundries is the leading candidate to buy IBM’s chip unit, which is apparently on the block. To date, however, GlobalFoundries and IBM have yet to make any announcements on the... » read more

How Much Testing Is Enough?


As chipmakers move towards finer geometries, IC designs are obviously becoming more complex and expensive. Given the enormous risks involved, chipmakers must ensure the quality of the parts before they go out the door. And as part of quality assurance process, that requires a sound test strategy. But for years, IC makers have faced the same dilemma. On one hand, they want a stringent test me... » read more

Test Challenges Rising For Mobile Devices


Smartphone and tablets continue to advance at a dizzying pace. On the component side alone, the latest mobile devices are moving towards 64-bit application processors, multi-mode RF front-ends, higher-end cameras and flashy LCD screens. Some systems even boast fingerprint scanners and heart rate sensors. But an obvious part of the system continues to lag behind the curve—battery life. In r... » read more

NAND ATE Market Gets Testy


The NAND flash memory market is undergoing big changes. As planar NAND moves further down the 1xnm node regime, suppliers are ramping up devices with new cell structures, interfaces and other features. And on top of that, 3D NAND is beginning to appear in the market. The next-generation NAND devices will enable new applications in the mobile and enterprise markets, but the chips themselves p... » read more

The Week In Review: Manufacturing And Design


Blocking cell phone use and texting while driving have been proposed by the U.S. government and for good reason. About 10 people a day are killed in “distraction-affected” car accidents in the U.S., according to the U.S. National Highway Traffic Safety Administration. As a result, some companies are developing technologies that can block texts while driving. But according to Strategy Analyt... » read more

ATE Market Changes With The Times


By Jeff Chappell A declining PC market in recent years coupled with the continuing growth of mobile phones and tablets has meant changes throughout the semiconductor supply chain, and automated test equipment is no exception. For example, a decade ago memory test—namely DRAM—was a large market compared with that of nascent system-on-a-chip (SoC) testing. In fact, at the time some test e... » read more