tag: MEMS

The Future of Testing
By Jeff Dorsch - 08 May, 2017 - Comments: 0

In our previous test blog posts, we looked at the history of automated test equipment for semiconductors and for printed circuit boards. This month, we look ahead to the test technologies that are emerging. The chip ATE field has essentially boiled down to Advantest, Teradyne, and Xcerra (LTX-Credence), while the board test market is dominated by Teradyne and Keysight Technologies (formerly ... » read more

Wirebond Technology Rolls On
By Mark LaPedus - 08 May, 2017 - Comments: 2

Several years ago, many predicted the demise of an older interconnect packaging technology called wire bonding, prompting the need for more advanced packaging types. Those predictions were wrong. The semiconductor industry today uses several advanced packaging types, but wire bonding has been reinvented over the years and remains the workhorse in packaging. For example, Advanced Semiconducto... » read more

Whatever Happened To High-Level Synthesis?
By Brian Bailey - 26 Apr, 2017 - Comments: 0

A few years ago, [getkc id="105" comment="high-level synthesis"] (HLS) was probably the most talked about emerging technology. It was to be the heart of a new Electronic System Level (ESL) flow. Today, we hear much less about the progress being made in this area. Semiconductor Engineering sat down to discuss this with Bryan Bowyer, director of engineering for high level design and verificati... » read more

RF Device And Process Biz Heats Up
By Mark LaPedus - 26 Apr, 2017 - Comments: 0

The RF device and process technology markets are heating up, especially for two critical components used in smartphones—RF switch devices and antenna tuners. RF device makers and their foundry partners continue to ramp up traditional RF switch chips and tuners based on RF SOI process technologies for today’s 4G wireless networks. And recently, [getentity id="22819" comment="GlobalFoundri... » read more

Time For Massively Parallel Testing
By Jeff Dorsch - 12 Apr, 2017 - Comments: 0

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory devices and other semiconductors, test equipment vendors have resorted to parallel testing technology, simultaneously testing multiple chips at a time. The industry also is turning to system-level tes... » read more

How Testing MEMS, Sensors Is Different
By Jeff Dorsch - 10 Apr, 2017 - Comments: 2

When it comes to testing microelectromechanical system devices and sensors, sometimes you have to shake and bake. [getkc id="311" comment="MEMS"] and [getkc id="187" kc_name="sensors"] are physically different from standard ICs. They require a specific type of stimulus to get the required testing results. Most chips only need to have an electrical charge run through them to gauge their pass/... » read more

What’s New On The MEMS Horizon?
By Mike Rosa - 16 Mar, 2017 - Comments: 0

In my previous blog post, I discussed emerging trends and the increased demand for MEMS; now I’ll focus on what we can expect in the immediate future in terms of new device technologies and MEMS-enabled products. While the more well-known MEMS such as accelerometers, gyroscopes, microphones and pressure sensors continue to grow in volume as they find new applications in things like wire... » read more

MEMS Microphones: A Bright Spot Among Commoditized Consumer Sensors
By Jun Yan - 16 Mar, 2017 - Comments: 0

MEMS microphones have emerged as a bright spot among consumer sensors, which in general are going through a rapid commoditization and profit-squeezing trend. To understand what’s driving the MEMS microphone market, consider that the Apple iPhone 7 and 7S each have 4 MEMS microphones. As reported by System Plus Consulting, the latest iPhones have “a front-facing top microphone, presumably f... » read more

MEMS: Improving Cost And Yield
By Ed Sperling - 13 Mar, 2017 - Comments: 2

MEMS devices inspire awe on the design side. On the test and manufacturing side, they evoke a different kind of reaction. These are, after all, the intersection of mechanical and electrical engineering—a joining of two miniature worlds that are the basis of some of the most complex technology on the planet. But getting these devices to yield sufficiently, understanding what does or does no... » read more

Advanced Wafer Level Packaging Of RF-MEMS With RDL Inductor
By STATS ChipPAC - 06 Mar, 2017 - Comments: 0

The market for portable and mobile data access devices that are wirelessly connected to the cloud anytime and anywhere is exploding. The trend to access any network from anywhere is driving increased functional convergence in the radio, which translates into increased packaging complexity and sophistication. This is creating unprecedented demand for RF components providing more integration- in ... » read more

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