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Testing More To Boost Profits


Not all chips measure up to spec, but as more data becomes available and the cost of these devices continues to rise, there is increasing momentum to salvage and re-purpose chips for other applications and markets. Performance-based binning is as old as color-banded resistors, but the practice is spreading — even for the most advanced nodes and packages. Over the last three decades, engine... » read more

Transforming Vision Inspection With Machine Learning


How auto-manufacturers can apply ML & AI algorithms to enhance image analytics on their factory floor and to ensure higher product quality? Discover the next generation visual inspection in our new case study. In this case study , you will learn about: Current limitations of image inspection in the manufacturing industry. The O+ end-to-end solution, which brings machine learning and... » read more

Adaptive Test Gains Ground


Not all devices get tested the same way anymore, and that’s a good thing. Quality, test costs, and yield have motivated product engineers to adopt test processes that fall under the umbrella of adaptive test, which uses test data to modify a subsequent test process. But to execute such techniques requires logistics that support analysis of data, as well as enabling changes to a test based ... » read more