tag: National Instruments

Chip Industry Silos Are Crimping Advances
By Brian Bailey - 11 Jan, 2024 - Comments: 0

Change is never easy, but it is more difficult when it involves organizational restructuring. The pace of such restructuring has been increasing over the past decade, and often it is more difficult to incorporate than technological advancements. This is due to the siloed nature of the semiconductor industry, both within the industry itself, and its relationship to surrounding industries. Inc... » read more

Blog Review: Jan. 10
By Liz Allan - 10 Jan, 2024 - Comments: 0

Keysight’s Jenn Mullen explains how ChatGPT’s tools can help quality assurance (QA) engineers and software testers overcome test automation debt, and become more productive and able to deliver consistently high-quality products to market faster. Siemens’ Keith Felton discusses how the paradigm of “shift-left” power delivery analysis has emerged as a critical methodology in addressi... » read more

Pressure Builds On Failure Analysis Labs
By Laura Peters - 09 Jan, 2024 - Comments: 0

Failure analysis labs are becoming more fab-like, offering higher accuracy in locating failures and accelerating time-to-market of new devices. These labs historically have been used for deconstructing devices that failed during field use, known as return material authorizations (RMAs), but their role is expanding. They now are becoming instrumental in achieving first silicon and ramping yie... » read more

Application-Oriented Testing Of SiC Power Semiconductors
By NI - 09 Jan, 2024 - Comments: 0

SiC (silicon carbide) has established itself as an important material in the semiconductor market because it has many outstanding properties. In comparison with silicon, SiC offers a higher electrical breakdown voltage, resulting in improved component performance and efficiency. It also allows for operation at higher temperatures, which makes heat dissipation easier and enables improved perform... » read more

Wireless Trend Predictions For 2024 And Their Impact On The Test And Measurement Industry
By Niklas Nolemo - 09 Jan, 2024 - Comments: 0

The ever-evolving landscape of wireless technology continues to shape how we connect, communicate, and innovate. Connected systems continue to grow in complexity and reliance on one another which will impact the test & measurement industry significantly.  As we step into the year 2024, several key wireless trends are set to dominate the industry, ushering in a new era of connectivity and r... » read more

Testing ICs Faster, Sooner, And Better
By Laura Peters - 12 Dec, 2023 - Comments: 0

The infrastructure around semiconductor testing is changing as companies build systems capable of managing big data, utilizing real-time data streams and analysis to reduce escape rates on complex IC devices. At the heart of these tooling and operational changes is the need to solve infant mortality issues faster, and to catch latent failures before they become reliability problems in the fi... » read more

Unleashing The Power Of Test Through Data
By James Guilmart - 12 Dec, 2023 - Comments: 0

In the relentless pursuit of technological innovation, test engineers find themselves facing ever-increasing pressures to deliver flawless products at an unprecedented pace. From the rapid evolution of autonomous vehicles to the advent of 5G and beyond, the demands on engineering teams continue escalating. While organizations strive to optimize their testing processes, the need for efficient te... » read more

System State Challenges Widen
By Brian Bailey - 30 Nov, 2023 - Comments: 0

Knowing the state of a system is essential for many analysis and debug tasks, but it's becoming more difficult in heterogeneous systems that are crammed with an increasing array of features. There is a limit as to how many things engineers can keep track of, and the complexity of today's systems extends far beyond that. Hierarchy and abstraction are used to help focus on the important aspect... » read more

Rebalancing Test And Yield In IC Manufacturing
By Gregory Haley - 07 Nov, 2023 - Comments: 0

Balancing yield and test is essential to semiconductor manufacturing, but it's becoming harder to determine how much weight to give one versus the other as chips become more specialized for different applications. Yield focuses on maximizing the number of functional chips from a production batch, while test aims to ensure that each chip meets rigorous quality and performance standards. And w... » read more

Ensuring A Connected World With FiRA-Certified Solutions
By Alejandro Escobar Calderon - 07 Nov, 2023 - Comments: 0

In our rapidly evolving technological landscape, wireless standards play a pivotal role in ensuring the seamless operation of various wireless devices and networks. As the demand for reliable and high-performance wireless technologies continues to grow, the role of test vendors in certifying compliance with these standards becomes increasingly important. Wireless standards serve as the found... » read more

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