How New Diagnostic Data And Operations Equip Flash Memory ICs For The Demands Of Automotive Functional Safety Standards


Automotive systems OEMs are starting to demand a new breed of flash ICs which can support the requirements of functional safety design at the system level better than previous generations of devices. This article studies the mode of operation of conventional NOR flash ICs, and explains the features that new automotive serial flash products will need to offer if they are to fully support system ... » read more

Design Optimization Of Split-Gate NOR Flash For Compute-In-Memory


A technical paper titled “Design Strategies of 40 nm Split-Gate NOR Flash Memory Device for Low-Power Compute-in-Memory Applications” was published by researchers at Seoul National University of Science and Technology and University of Seoul. Abstract: "The existing von Neumann architecture for artificial intelligence (AI) computations suffers from excessive power consumption and memo... » read more

More Errors, More Correction in Memories


As memory bit cells of any type become smaller, bit error rates increase due to lower margins and process variation. This can be dealt with using error correction to account for and correct bit errors, but as more sophisticated error-correction codes (ECC) are used, it requires more silicon area, which in turn drives up the cost. Given this trend, the looming question is whether the cost of ... » read more

Week in Review: IoT, Security, Auto


Internet of Things Tony Franklin, Intel’s general manager for Internet of Things Segments, is interviewed by Lorin Fries on how the chipmaker is helping to develop smart farming applications. “We focus primarily on high-performance computer technologies, as well as communication technologies, which have great applicability for food systems. We work closely with a broad ecosystem of partner... » read more