tag: Optimal Plus

Gaps Emerge In Automotive Test
By Ed Sperling - 07 May, 2019 - Comments: 1

Demands by automakers for zero defects over 18 years are colliding with real-world limitations of testing complex circuitry and interactions, and they are exposing a fundamental disconnect between mechanical and electronic expectations that could be very expensive to fix. This is especially apparent at leading-edge nodes, where much of the logic is being developed for AI systems and image se... » read more

Data Sharing And Digital Threads
By Michael Schuldenfrei - 07 May, 2019 - Comments: 0

Electronics and the components that power them are more complex and advanced than ever. With these products an integral part of our daily lives, their reliability has become nothing less than mission-critical. As the demand for components accelerates, it is important that quality is not compromised under the pressure to meet quantity requirements. Otherwise we’re going to be seeing a lot of r... » read more

New Approaches To Security
By Ed Sperling - 09 Apr, 2019 - Comments: 0

Different approaches are emerging to identify suspicious behavior and shut down potential breaches before they have a chance to do serious damage. This is becoming particularly important in markets where safety is an issue, and in AI and edge devices where the rapid movement of data is essential. These methods are a significant departure from the traditional way of securing devices through l... » read more

The 3 Main Obstacles To Zero DPPM And How To Overcome Them
By Randy Hierbaum - 12 Mar, 2019 - Comments: 0

As we all well know, there are multiple mission critical applications in today’s “Age of Smart” that are calling for zero DPPM (defective parts per million) in semiconductors and electronic systems. In industries such as automotive, medical, aerospace, and more, where lives are at stake, defective parts are not an option. The quality imperative However, with the ever-growing complexi... » read more

Domain Expertise Becoming Essential For Analytics
By Ed Sperling - 12 Mar, 2019 - Comments: 0

Sensors are being added into everything, from end devices to the equipment used to make those sensors, but the data being generated has limited or no value unless it's accompanied by domain expertise. There are two main problems. One is how and where to process the vast amount of data being generated. Chip and system architectures are being revamped to pre-process more of that data closer to... » read more

Module Testing Adds New Challenges
By Jeff Dorsch - 07 Aug, 2017 - Comments: 1

System-in-package (SiP) and other advanced packaging technologies are putting more components together in tighter spaces than previously seen. Often these packages are contained in a module, which is something more than a chip package and a great deal smaller than most printed circuit boards. Testing these modules often requires system-level test. These modules typically will be inserted int... » read more

Who’s Responsible For Transistor Aging Models?
By Ann Mutschler - 13 Jul, 2017 - Comments: 0

While there are a number of ways to go about reliability and transistor aging analysis, it is all in large part dependent on fabs and foundries to provide the aging models. The situation is also not entirely clear in the semiconductor ecosystem because the classic over-the-wall mentality between design and manufacturing still exists. And unfortunately this wall is bi-directional. Not only... » read more

Listening To The Voice Of Your Product
By Optimal Plus - 05 Jun, 2017 - Comments: 0

Much has been said and written about the business values of the Industrial Internet of Things (IIoT). Through connecting the manufacturing elements (machines) on the factory floor, and collecting and analyzing their data, manufacturers can significantly improve the efficiency and profitability of their operations through intelligent predictive maintenance of equipment and optimal equipment ut... » read more

Testing IoT Devices
By Jeff Dorsch - 05 Jun, 2017 - Comments: 3

Internet of Things devices present new challenges in testing. Some devices can be tested the same way as standard semiconductors are now tested, but others call for different approaches. Microcontrollers and other chips that go into safety-critical applications — medical devices, military/aerospace systems, and automotive electronics — need their own kind of testing to make sure they wil... » read more

Is Product Quality Getting Lost In The IIoT?
By David Park - 10 Apr, 2017 - Comments: 0

Manufacturing operations have continuously evolved using data capture and management to assess and test production effectiveness on the manufacturing floor. The advent of the Industrial Internet of Things (IIoT) and its anticipated ability to track and manage the factory environment with machine-to-machine process analytics heralds yet another transformation, promising a higher level of data in... » read more

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