tag: reliability

Recent Developments in Neuromorphic Computing, Focusing on Hardware Design and Reliability
By Technical Paper Link - 08 May, 2023 - Comments: 0

A new technical paper titled "Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies" was published by researchers at Univ. Lyon, Ecole Centrale de Lyon, Univ. Grenoble Alpes, Hewlett Packard Labs, CEA-LETI, and Politecnico di Torino. Abstract "The field of neuromorphic computing has been rapidly evolving in recent years, with an incre... » read more

GaN Power Devices: Stability, Reliability and Robustness Issues
By Technical Paper Link - 30 Apr, 2023 - Comments: 0

A technical paper titled "Stability, Reliability, and Robustness of GaN Power Devices: A Review" was published by researchers at Virginia Polytechnic Institute and State University, Johns Hopkins University Applied Physics Laboratory, and Kyushu University. "Gallium nitride (GaN) devices are revolutionarily advancing the efficiency, frequency, and form factor of power electronics. However, t... » read more

Designing For In-Circuit Monitors
By Ann Mutschler - 27 Apr, 2023 - Comments: 0

In every application space the semiconductor ecosystem touches, in-circuit monitors and sensors are playing an increasing role in silicon lifecycle management and concepts around reliability and resiliency — both during design as well as in the field. The combination of true system-level design, in/on-chip monitors, and improved data analysis are expected to drastically improve reliability... » read more

Easy-To-Use Reliability Checks Throughout The Design Cycle From IP To Full-Chip Tapeout
By Hossam Sarhan - 27 Apr, 2023 - Comments: 0

By Hossam Sarhan and Alexandre Arriordaz With the increasing complexity of design layouts and shorter tapeout cycles, waiting until signoff verification is no longer practical for design teams. There is a constant push to shift targeted verification activities “left” to earlier stages in the design flow. Finding and eliminating selected errors earlier during design and implementation, wh... » read more

Pre-Layout, Post-Layout Circuit Reliability
By Siemens EDA - 26 Apr, 2023 - Comments: 0

With the increasing complexity of design layouts and shorter tapeout cycles, waiting until signoff verification to check design reliability is no longer practical for design teams. Designers must now apply reliability verification checks throughout the design flow, from intellectual property (IP) level to full-chip level, to ensure they meet tapeout schedules while confirming design reliability... » read more

State of the Art And Future Directions of Rowhammer (ETH Zurich)
By Technical Paper Link - 18 Apr, 2023 - Comments: 0

A new technical paper titled "Fundamentally Understanding and Solving RowHammer" was published by researchers at ETH Zurich. Abstract "We provide an overview of recent developments and future directions in the RowHammer vulnerability that plagues modern DRAM (Dynamic Random Memory Access) chips, which are used in almost all computing systems as main memory. RowHammer is the phenomenon in... » read more

How To Plan And Conduct Highly Accelerated Life Testing
By Chris South - 13 Apr, 2023 - Comments: 0

Assessing the robustness of an electronic product is integral to successful design and performance. Highly accelerated life testing (HALT) is an important testing tool for this purpose, and its effectiveness can be maximized through careful planning prior to setup and detailed execution. What is HALT? HALT is the process of applying increased stressors to an electronic device to force failure... » read more

What Data Center Chipmakers Can Learn From Automotive
By Anne Meixner - 11 Apr, 2023 - Comments: 2

Automotive OEMs are demanding their semiconductor suppliers achieve a nearly unmeasurable target of 10 defective parts per billion (DPPB). Whether this is realistic remains to be seen, but systems companies are looking to emulate that level of quality for their data center SoCs. Building to that quality level is more expensive up front, although ultimately it can save costs versus having to ... » read more

Impact Of Increased IC Performance On Memory
By Ed Sperling - 30 Mar, 2023 - Comments: 0

Increasing performance in advanced semiconductors is becoming more difficult as chips become more complex. There are more physical effects to contend with, different use cases, and challenges in making memory go faster. In addition, aging effects that once were ignored are now becoming critical concerns. Steven Woo, fellow and distinguished inventor at Rambus, talks about different factors that... » read more

Trusted Sensor Technology For The Internet Of Things
By Dirk Mayer - 27 Mar, 2023 - Comments: 0

“Data is the new oil” — Clive Humby, 2006 While this prediction relates to the value that can be generated from data, the focus here is on the tools at the oil well. Just as oil drilling platforms are expected to reliably produce crude oil around the clock, sensors are expected to reliably and continuously deliver high-quality data. But sensors have long since evolved from simple me... » read more

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