Designing Resilient Electronics


Electronic systems in automobiles, airplanes and other industrial applications are becoming increasingly sophisticated and complex, required to perform an expanding list of functions while also becoming smaller and lighter. As a result, pressure is growing to design extremely high-performance chips with lower energy consumption and less sensitivity to harsh environmental conditions. If this ... » read more

Recent Earthquakes Highlight Risk To Semiconductor Manufacturing Sites


On July 4, 2019, southern California experienced a 6.4 magnitude earthquake followed by a 7.1 earthquake the next day. Both earthquakes occurred near the town of Ridgecrest, but they were not related to the San Andreas fault, an 800-mile fault zone in California where two tectonic plates meet. The San Andreas fault is generally considered to be where “the big one” could occur in California,... » read more

What Can Go Wrong In Automotive


Semiconductor Engineering sat down to discuss automotive engineering with Jinesh Jain, supervisor for advanced architectures in Ford’s Research and Innovation Center in Palo Alto; Raed Shatara, market development for automotive infotainment at [getentity id="22331" comment="STMicroelectronics"]; Joe Hupcey, verification product technologist at [getentity id="22017" e_name="Mentor Graphics"]; ... » read more

Overcoming The Limits Of Scaling


Semiconductor Engineering sat down to discuss the increasing reliance on architectural choices for improvements in power, performance and area, with [getperson id="11425" comment=" Sundari Mitra"], CEO of [getentity id="22535" comment="NetSpeed Systems"]; Charlie Janac, chairman and CEO of [getentity id="22674" e_name="Arteris"]; [getperson id="11032" comment="Simon Davidmann"] CEO of [getentit... » read more

New Approaches For Reliability


The definition of reliability hasn’t budged since the invention of the IC, but how to achieve it is starting to change. In safety-critical systems, as well as in markets such as aerospace, demands for reliability are so rigorous that they often require redundant circuitry—and for good reason. A PanAmSat malfunction in 1998 caused by tin whisker growth wiped out pagers for 45 million use... » read more