GaN Power Devices: Stability, Reliability and Robustness Issues

A technical paper titled "Stability, Reliability, and Robustness of GaN Power Devices: A Review" was published by researchers at Virginia Polytechnic Institute and State University, Johns Hopkins University Applied Physics Laboratory, and Kyushu University. "Gallium nitride (GaN) devices are revolutionarily advancing the efficiency, frequency, and form factor of power electronics. However, t... » read more

When Is Robustness Verification Complete?

Understandably, hardware designed for an aircraft, or indeed any safety critical application, must be robust. I also believe that all engineers wish to verify their designs as thoroughly as possible, anyway. However, there are limiting factors; most notably the high complexity of most designs. Since we are unable to discover and verify the design against all abnormal conditions, the main questi... » read more

Copy-Row DRAM (CROW) : Substrate for Improving DRAM

Source/Credit: ETH Zurich & Carnegie Mellon University Click here for the technical paper and here for the power point slides » read more

Adaptive Test With Test Escape Estimation for Mixed-Signal ICs

Abstract: The standard approach in industry for post-manufacturing testing of mixed-signal circuits is to measure the performances that are included in the data sheet. Despite being accurate and straightforward, this approach involves a high test time since there are numerous performances that need to be measured sequentially by switching the circuit into different test configurations. Adapt... » read more