Janusz Kitel

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Janusz Kitel is a requirements management specialist at Aldec. He has five years of experience in requirements engineering and more than 10 years of experience in product quality assurance. Kitel received his M.S. in Electronics and Telecommunication from Silesian University of Technology and increased his knowledge about software engineering from complementary studies at AGH University of Science and Technology (Poland). His practical engineering experience includes areas in functional verification, DO-254 compliance and software development.

Author's Latest Posts

When Is Robustness Verification Complete?

By Janusz Kitel - 19 Dec, 2019 - Comments: 0

Understandably, hardware designed for an aircraft, or indeed any safety critical application, must be robust. I also believe that all engineers wish to verify their designs as thoroughly as possible, anyway. However, there are limiting factors; most notably the high complexity of most designs. Since we are unable to discover and verify the design against all abnormal conditions, the main questi... » read more

Of Aero Shows And Safety

By Janusz Kitel - 28 Mar, 2019 - Comments: 0

At the end of February, I attended the Aero Show in India - and what a show it was. So many exhibitors from around the world, including all main players from the commercial and military sides of the aerospace industry. Visitors could see everything required to build a modern aircraft: from small components like specialized ICs, cables and connectors up to big parts, such as the jet engines... » read more

Traceability Matrices: Headache Or Real Value?

By Janusz Kitel - 24 Aug, 2017 - Comments: 0

Traceability is becoming increasingly important in most engineering projects, if only on the grounds of ‘good practice,’ and it is specifically required for projects that have to meet safety standards such as DO-254 and ISO 26262. To provide traceability, you must maintain the relationships between all aspects of a project; from the system-level requirements through implementation and ve... » read more