tag: S-parameters

Why Are S-Parameters Superior For Power Module Optimization?
By Siemens EDA - 05 Oct, 2023 - Comments: 0

A power module is a high-power switching circuit – used in electric vehicles, renewable energy, photovoltaics, wind, and many more applications – that uses insulated gate bipolar transistors (IGBT) or metal-oxide-semiconductor field-effect transistors as switching elements. This paper discusses the difference in power module simulation using lumped elements and S-Parameters. Using a simple ... » read more

Integration Of S-Parameters For Power Module Verification Into The Engineers’ Design Environment
By Wilfried Wessel - 07 Sep, 2023 - Comments: 0

By Wilfried Wessel (Siemens EDA), Simon Liebetegger (University of Applied Sciences Darmstadt), and Florian Bauer (Siemens EDA) Developing a power module requires enhanced design and verification methods. Currently, multiple iterations are needed to get the design done. Today, design and manufacturing processes are heavily dependent on physical prototypes. The reason for this is the unique s... » read more

How To Use S-Parameters For Power Module Verification
By Wilfried Wessel - 06 Jul, 2023 - Comments: 0

By Wilfried Wessel (Siemens EDA), Simon Liebetegger (University of Applied Sciences Darmstadt), and Florian Bauer (Siemens EDA) Power modules are high-power switching circuits that convert DC- in AC-currents in electric vehicles, renewable energy, and many more applications. New materials [14] and device technologies [14], such as wide bandgap semiconductors, including silicon carbide (SiC) ... » read more

A Customized Low-Cost Approach For S-Parameter Validation Of ATE Test Fixtures
By Zhenhua Chen - 06 Dec, 2022 - Comments: 0

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification challenges. Users need to measure the DUT test fixture quickly and easily, while making sure the measurements mimic the ATE-to-test-fixture interface performance and determining how to handle DUT ... » read more

The Development Of Front-End Module For 5G Millimeter-Wave Device Testing
By Advantest - 11 Oct, 2022 - Comments: 0

This article describes the development of a front-end module for 5G millimeter-wave device testing. 5G millimeter-wave is planned to be used up to the 53 GHz band. Our challenges are to optimize the performance of our test system up to that frequency band including wide power range of EVM performance, and to add a new one-port S-Parameter measurement function. We describe the elemental technolo... » read more

The Complex Art Of Handling S-Parameters
By Pradeep Thiagarajan - 12 Sep, 2022 - Comments: 1

By Pradeep Thiagarajan and Youssef Abdelkader IC design is transforming at an accelerated pace along with fabrication technology. The need to incorporate more functionality has led to denser dies, multi-die chips, stacked 3D ICs, and advanced packaging. Furthermore, the increasing demand for enhanced connectivity with more and faster access to data continues to drive technology towards highe... » read more

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