Virtual Metrology In Semiconductor Manufacturing


Fourth in a seven-part series: Virtual metrology may never be 100% perfect because of the almost unlimited number of changes in a fab tools and the unique chip and wafer designs they're being used to process. But there are places where virtual metrology does make sense. Jon Herlocker, vice president and general manager of software analytics at Cohu, talks about why virtual metrology will never ... » read more

Advanced Features Of High-Speed Digital I/O Devices: Data Delay


In high speed digital communications, because of factors such as setup time and hold time, it might be important to delay the data from the edge of the clock. The different settings and parameters that affect data delay are discussed in this white paper. To read more, click here. » read more