Manufacturing Bits: Feb. 21

AFM-on-a-chip An atomic force microscope (AFM) is a metrology tool that can measure and characterize structures in three dimensions. It uses a tiny probe to enable measurements in chip structures, but the instrument itself is often a large and bulky system. In response, the University of Texas at Dallas has devised an AFM-on-a-chip technology. The AFM is roughly the size of a dime. Based on... » read more