Power Delivery Challenged By Data Center Architectures


Processor and data center architectures are changing in response to the higher voltage needs of servers running AI and large language models (LLMs). At one time, servers drew a few hundred watts for operation. But over the past few decades that has changed drastically due to a massive increase in the amount of data that needs to be processed and user demands to do it more quickly. NVIDIA's G... » read more

Voltage Drop Now Requires Dynamic Analysis


At one time a relatively infrequent occurrence, voltage drop is now a major impediment to reliability at advanced nodes. Decades ago, voltage drop was only an issue for very large and high-speed designs, where there was concern about supply lines delivering full voltage to transistors. As design margins have tightened in modern advanced designs, controlling voltage drop has become a requiremen... » read more

Blog Review: Aug. 7


Synopsys' Jyotika Athavale and Randy Fish investigate the problem of silent data corruption caused by difficult-to-detect hardware defects that cause unnoticed errors in the data being processed and is becoming an increasingly pressing problem as computing scales massively at a rapid pace with the demands of AI. Siemens' Keith Felton suggests adopting physical design reuse circuits to provid... » read more

Focus Shifts To Application-Specific Workloads


Experts At The Table: EDA has undergone numerous workflow changes over time. Different skill sets have come into play over the years, and at times this changed the definition of what it means to design at the system level. To work out what this means for designers today, and how it looks going forward, Semiconductor Engineering sat down with Michal Siwinski, chief marketing officer at Arteris; ... » read more

Ensure Reliability In Automotive ICs By Reducing Thermal Effects


In the relentless pursuit of performance and miniaturization, the semiconductor industry has increasingly turned to 3D integrated circuits (3D-ICs) as a cutting-edge solution. Stacking dies in a 3D assembly offers numerous benefits, including enhanced performance, reduced power consumption, and more efficient use of space. However, this advanced technology also introduces significant thermal di... » read more

Chip Security Now Depends On Widening Supply Chain


Securing chips is becoming more challenging as SoCs are disaggregated into chiplets, creating new vulnerabilities that involve hardware and software, as well as multiple entities, and extending threats across a much broader supply chain. In the past, much of the cyber threat model was confined to either hardware or software, and where multiple vendors were involved, various chips were separa... » read more

Defining Chip Threat Models To Identify Security Risks


Experts At The Table: As hardware weaknesses have become a major target for attackers, the race to find new ways to strengthen chip security has begun to heat up. But one-size does not fit all solution. To figure out what measures need to be taken, a proper threat model must be assessed. Semiconductor Engineering sat down with a panel of experts at the Design Automation Conference in San Franci... » read more

Where Power Savings Really Count


Experts at the Table: Semiconductor Engineering sat down to discuss why and where improvements in architectures and data movement will have the biggest impact, with Hans Yeager, senior principal engineer, architecture, at Tenstorrent; Joe Davis, senior director for Calibre interfaces and EM/IR product management at Siemens EDA; Mo Faisal, CEO of Movellus; Trey Roessig, CTO and senior vice presi... » read more

Blog Review: July 31


Cadence's Jasmine Makhija explains how to boost the performance of CXL 3.0 by using NOP (No Operation) Insertion Hints in latency-optimized 256B Flit Mode, which enables the system to quickly revert to the low-latency path after temporarily switching to a higher-latency path due to error correction needs. Synopsys' Robert Fey finds that by automatically and dynamically linking requirements a... » read more

Here At Last! Automated Verification Of Heterogeneous 2D/3D Package Connectivity


By Michael Walsh and Jin Hou with Todd Burkholder The heterogeneous integration of multiple ICs in a single package along with high-performance, high-bandwidth memory is critical for many high-performance computing applications. After everything has been heterogeneously integrated and packaged, such designs feature complex connectivity with many hundreds of thousands of connections, making i... » read more

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