Hunting For Hardware-Related Errors In Data Centers


The semiconductor industry is urgently pursuing design, monitoring, and testing strategies to help identify and eliminate hardware defects that can cause catastrophic errors. Corrupt execution errors, also known as silent data errors, cannot be fully isolated at test — even with system-level testing — because they occur only under specific conditions. To sort out the environmental condit... » read more

Mitigating Silent Data Corruptions in High Performance Computing


A new technical paper titled "Mitigating silent data corruptions in HPC applications across multiple program inputs" was published by researchers at University of Iowa, Baidu Security, and Argonne National Lab. The paper was a Best Paper finalist at SC22. The researchers "propose MinpSID, an automated SID framework that automatically identifies and re-prioritizes incubative instructions in a... » read more

Silent Data Corruption


Defects can creep into chip manufacturing from anywhere, but the problem is getting worse at advanced nodes and in advanced packages where reduced pin access can make testing much more difficult. Ira Leventhal, vice president of U.S. Applied Research and Technology at Advantest America, talks about what’s causing these so-called silent data errors, how to find them, and why it now requires ma... » read more

Assuring Reliable Processor Performance At Scale


In today’s data center environment, resilience is key. Cloud providers are built on as-a-service business models, where uptime is critical to ensure their customers’ business continuity. Reputation and competitiveness require service at extremely high performance, low power, and increasing functionality, with zero tolerance for unplanned downtime or errors. If you’re a hyperscaler, o... » read more

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