tag: STM

Fast Time-Resolved Scanning Tunneling Microscopy (STM) for Nanostructures
By Technical Paper Link - 27 Feb, 2023 - Comments: 0

A new technical paper titled "Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resolution of tens-picosecond" was published by researchers at University of Tsukuba and UNISOKU Co. According to the U. of Tsukaba news article, "OPP STM is an essential method for measuring photo-induced charge carrier dynamics in nanostructures, but requires technical advances... » read more

Improving EUV Process Efficiency
By Mark LaPedus - 19 Mar, 2020 - Comments: 2

The semiconductor industry is rethinking the manufacturing flow for extreme ultraviolet (EUV) lithography in an effort to improve the overall process and reduce waste in the fab. Vendors currently are developing new and potentially breakthrough fab materials and equipment. Those technologies are still in R&D and have yet to be proven. But if they work as planned, they could boost the flo... » read more

DAC Day Two: Down To Business
By Brian Bailey - 07 Jun, 2016 - Comments: 0

DAC day two started with a breakfast presentation put on by Synopsys which included guests from ARM, TSMC and HiSilicon. It was titled Collaborating to Enable Design with the latest processors and finFET processes. Collaboration is a word that we hear increasingly when talking about the advanced nodes and today we are truly at the point where one company cannot do it all. Ron Moore, VP of ma... » read more

Manufacturing Bits: July 28
By Mark LaPedus - 28 Jul, 2015 - Comments: 0

Molecular chips Researchers from various organizations have devised a transistor consisting of a single molecule and a few atoms. The work could one day lead to the integration of molecular-based devices with existing semiconductor technologies. This work was conducted by Paul-Drude-Institut für Festkörperelektronik (PDI), Freie Universität Berlin (FUB), NTT and the U.S. Naval Research L... » read more

Manufacturing Bits: Jan. 27
By Mark LaPedus - 27 Jan, 2015 - Comments: 0

Calibration systems go portable The National Institute of Standards and Technology (NIST) is selling a new portable, vacuum-based calibration unit for use in instruments and other systems. The system, dubbed the Portable Vacuum Standard (PVS), is a compact unit that enables precise calibrations and measurements at a customer’s facility. Housed in the white “igloo” enclosure, the syste... » read more

Quantum Computer Race Heats Up
By Mark LaPedus - 20 Feb, 2014 - Comments: 0

For years, there has been an intense race among various nations to develop the world’s fastest supercomputers. The U.S. and Japan led the field until 2010, when China stunned the market and rolled out the world’s fastest supercomputer. And today, China continues to lead the field with a supercomputer capable of running at speeds of 33.86 petaflops per second. While the supercomputer race... » read more

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