Chip Industry Week In Review

By The SE Staff - 15 Dec, 2023 - Comments: 0

By Jesse Allen, Gregory Haley, and Liz Allan Synopsys acquired Imperas, pushing further into the RISC-V world with Imperas' virtual platform technology for verifying and emulating processors. Synopsys has been building up its RISC-V portfolio, starting with ARC-V processor IP and a full suite of tools introduced last month. The first high-NA EUV R&D center in the U.S. will be built at... » read more

Using Real Workloads To Assess Thermal Impacts

By Ann Mutschler - 14 Dec, 2023 - Comments: 0

Thermal analysis is being driven much further left in the design, fueled by demand for increased transistor density and more features on a chip or in a package, as well as the unique ways the various components may be exercised or stressed. However, getting a clear picture of the thermal activity in advanced-node chips and packages is extremely complex, and it can vary significantly by use c... » read more

Data Formats For Inference On The Edge

By Brian Bailey - 14 Dec, 2023 - Comments: 0

AI/ML training traditionally has been performed using floating point data formats, primarily because that is what was available. But this usually isn't a viable option for inference on the edge, where more compact data formats are needed to reduce area and power. Compact data formats use less space, which is important in edge devices, but the bigger concern is the power needed to move around... » read more

Advanced Design Debug Demands Integrated Verification Management

By Robert Ruiz - 14 Dec, 2023 - Comments: 0

Design verification has been the dominant portion of chip development for years, and the challenges grow bigger every day. Single dies continue to grow in transistor count and complexity. Advanced techniques such as 2.5D and 3D multi-die systems and emerging technologies such as wafer-scale integration pack even more transistors and functionality into a single device. This situation has created... » read more

Very Short Reach SerDes In Data Centers

By Ed Sperling - 13 Dec, 2023 - Comments: 0

Speed is critical inside of data centers, and the distance that signals have to travel can have a big impact on time to results. But there are a number of variables that need to be considered, including what is an acceptable loss, how much power can be dissipated in a server rack, and what are the various connection options being used. Keivan Javadi Khasraghi, staff technical product manager at... » read more

Blog Review: December 13

By Jesse Allen - 13 Dec, 2023 - Comments: 0

Synopsys' Charles Dittmer discusses key and emerging use cases for Bluetooth Low Energy and how combining BLE with other wireless protocols can open new avenues of functionality for application areas including automotive, hearables, and retail. Cadence's Neelabh Singh points out changes in the terminologies describing USB4 links and shows the various possible link configurations put forth by... » read more

Testing ICs Faster, Sooner, And Better

By Laura Peters - 12 Dec, 2023 - Comments: 0

The infrastructure around semiconductor testing is changing as companies build systems capable of managing big data, utilizing real-time data streams and analysis to reduce escape rates on complex IC devices. At the heart of these tooling and operational changes is the need to solve infant mortality issues faster, and to catch latent failures before they become reliability problems in the fi... » read more

Mission Profile Analytics For The Automotive Industry

By Dan Alexandrescu - 12 Dec, 2023 - Comments: 0

The automotive industry is undergoing a major transformation with the rise of electrification, connectivity, and autonomous driving capabilities fueling the need for a greater number of more advanced semiconductors. The associated regulatory expectations are also creating challenging safety and reliability requirements for automotive-grade silicon that need to be understood and managed over a w... » read more

Deploying Cutting-Edge Adaptive Test Analytics Apps

By Ken Butler - 12 Dec, 2023 - Comments: 0

By Ken Butler, Advantest, and Guy Cortez, Synopsys Semiconductor test challenges abound in this era of AI. As such, semiconductor test engineering is increasingly moving towards fully adaptive test where each device receives the “right” test content to assess its correctness. Advantest and Synopsys have partnered to provide new cutting-edge real-time adaptive test applications at the te... » read more

Leveraging IBIS-AMI Models To Optimize PCIe 6.0 Designs

By Synopsys - 12 Dec, 2023 - Comments: 0

The exploding demand for more data driven by advancements such as artificial intelligence and machine learning has created an increase in bandwidth (BW) for interconnects for different systems and hardware components such as graphic cards, network cards, storge devices, CPUs, memories, and many more. PCIe is the leading high-speed serial communication protocol for connecting such hardware compo... » read more

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