tag: test

Can The Hardware Supply Chain Remain Secure?
By Andy Patrizio - 15 May, 2019 - Comments: 2

Malware in computers has been a reality since the 1990s, but lately the focus has shifted to hardware. So far, the semiconductor industry has been lucky because well-publicized threats were either limited or unproven. But sooner or later, luck runs out. Last year saw two significant incidents that shook people’s faith in the integrity of hardware security. The first was the Meltdown/Spectr... » read more

Next-Generation Vehicles Pose Automotive Semiconductor Test Challenges
By Advantest - 07 May, 2019 - Comments: 0

Various market trends are driving requirements for automotive semiconductor test as technology increasingly defines the future of the automobile. According to IHS Markit, the total market for semiconductors, having reached nearly $500 billion in 2018, will grow at a CAGR of 4.88% through 2022, while the automotive electronics category, reaching more than $40 billion in 2018, will outpace the to... » read more

Hidden Soldier Joints Inspection: 4 Case Studies
By DELTA, a part of FORCE Technology - 07 May, 2019 - Comments: 0

IC packaging technologies are becoming smaller and thinner. Ball grid array (BGA) packages were introduced some years ago in order to save space on the PCB, and are now widely used. To overcome the resulting problems with using optical microscopy as an inspection tool, the endoscope found its way into quality engineering departments. To read more, click here. » read more

Best Practices For Saving Measurement Data
By NI - 07 May, 2019 - Comments: 0

You collect data to make decisions. However, an inefficient file format may cause problems when analyzing your data. The key to choosing a file format for your application involves thinking about the current system requirements and how the file can adapt for future application needs. To help you organize your file format for your application, use the guide and checklist of questions: • Ho... » read more

Meeting ISO 26262 Requirements Using Tessent IC Test Solutions
By Mentor, a Siemens Business - 07 May, 2019 - Comments: 0

As the industry moves towards greater automation in vehicles, suppliers of the ICs used to drive the automotive electronic systems are rapidly adopting solutions to meet ISO 26262 requirements. The Tessent family of IC test products offers the highest defect coverage, in-system non-destructive memory test, hybrid ATPG/Logic BIST, and analog test coverage measurement. These technologies add up t... » read more

Gaps Emerge In Automotive Test
By Ed Sperling - 07 May, 2019 - Comments: 1

Demands by automakers for zero defects over 18 years are colliding with real-world limitations of testing complex circuitry and interactions, and they are exposing a fundamental disconnect between mechanical and electronic expectations that could be very expensive to fix. This is especially apparent at leading-edge nodes, where much of the logic is being developed for AI systems and image se... » read more

Modernizing Test In Aerospace And Defense
By Luke Schreier - 07 May, 2019 - Comments: 0

These days, you can’t attend a conference or have a conversation with leaders of the aerospace and defense community without touching on the modernization of the sector. This includes the integration of new technologies and processes to address aging equipment and fleets. The scale of the challenges in this space is too large, the costs are too high, and the impact of failure is too great to ... » read more

Making AI More Dependable
By Ed Sperling - 07 May, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, looks at why AI has taken so long to get going, what role it will play in improving the reliability of all chips, and how to use AI to improve the reliability of AI chips themselves. » read more

Automotive, AI Drive Big Changes In Test
By Ann Mutschler - 25 Apr, 2019 - Comments: 0

Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

Redefining Expectations for Test
By Synopsys - 24 Apr, 2019 - Comments: 0

New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

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