tag: test

Boosting Regression Throughput By Reusing Setup Phase Simulation
By Mentor, a Siemens Business - 10 Oct, 2018 - Comments: 0

This paper discusses how to write a design so the common initial setup phase simulation is done once and then used as a foundation to run different tests later on, including the ability to change test stimulus to simulate different test behaviors. It also discusses what type of designs are appropriate for this methodology and what a designer can do to make his/her design suitable for it. Also c... » read more

What is STS Software Bundle?
By NI - 08 Oct, 2018 - Comments: 0

The STS Software Bundle provides all the software tools and hardware drivers you need to efficiently develop and deploy test programs, interactively debug, and maintain and calibrate the NI Semiconductor Test System (STS). NI will release new bundles regularly to incorporate new functionality and hardware drivers. The STS Software Bundle includes tools for interactive measurements and debugg... » read more

Why Test Costs Will Increase
By Ed Sperling - 08 Oct, 2018 - Comments: 0

The economics of test are under siege. Long seen as a necessary but rather mundane step in ensuring chip quality, or a way of testing circuitry from the inside while it is still in use, manufacturers and design teams have paid little attention to this part of the design-through-manufacturing flow. But problems have been building for some time in three separate areas, and they could have a b... » read more

Improving In-System Test With Tessent VersaPoint Test Point Technology
By Mentor, a Siemens Business - 08 Oct, 2018 - Comments: 0

This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

So Many Waivers Hiding Issues
By Brian Bailey - 05 Oct, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss problems associated with domain crossings with Alex Gnusin, design verification technologist for Aldec; Pete Hardee, director, product management for Cadence; Joe Hupcey, product manager and verification product technologist for Mentor, a Siemens Business; Sven Beyer, product manager design verification for OneSpin; and Godwin Maben, applications en... » read more

Autonomous Vehicles: IC Design Flow Walk Through
By Andrew Macleod - 04 Oct, 2018 - Comments: 0

Automotive applications, particularly those related to AI and computer vision, are a significant driver of the current semiconductor boom. Established companies are mostly thriving, it’s true, but perhaps more interesting are all the new faces in the game. As usual, Mentor CEO Wally Rhines is one of the great sense-makers of the all this activity. Wally has been making the rounds at variou... » read more

Domain Crossing Nightmares
By Brian Bailey - 27 Sep, 2018 - Comments: 1

Semiconductor Engineering sat down to discuss problems associated with domain crossings with Alex Gnusin, design verification technologist for Aldec; Pete Hardee, director, product management for Cadence; Joe Hupcey, product manager and verification product technologist for Mentor, a Siemens Business; Sven Beyer, product manager design verification for OneSpin; and Godwin Maben, applications en... » read more

It’s All About Staying Ahead Of The Test Challenges Curve
By Steve Pateras - 11 Sep, 2018 - Comments: 0

Since the early days when semiconductor devices contained a mere handful of gates, the manufacturing test world has been focused on how to detect the greatest number of potential defects in the shortest amount of time. This fundamental goal has not changed over the years and continues at 5nm and beyond. What has dramatically changed over the years, however, is the variety of techniques used ... » read more

The Quest For Perfection
By Ed Sperling - 10 Sep, 2018 - Comments: 0

Demands by automakers for zero defects over 15 years are absurd, particularly when it comes to 10/7nm AI systems that will be the brains of autonomous and assisted driving or any mobile electronic device. There are several reasons for this. To begin with, no one has ever used a 10/7nm device under extreme conditions for any length of time. Chips developed at these nodes are just starting to ... » read more

5G Lessons Learned From Automotive Radar Test
By Advantest - 10 Sep, 2018 - Comments: 0

Situated between microwave and infrared waves, the millimeter-wave spectrum is the band of spectrum between 30 gigahertz (GHz) and 300GHz. It is used for high-speed wireless communications and is widely considered as the means to bring 5G into the future by allocating more bandwidth to deliver faster, higher-quality video, and multimedia content and services. Automotive radar is the entry point... » read more

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