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Technical Paper Round-Up: April 19


New technical papers include selective etching, ISO 26262 test bench, hardware accelerators, RISC-V, lidar, EUV mask inspection, fault attacks, edge computing, gallium oxide, and machine learning for VLSI CAD-on-chip power grid design. Cutting-edge research is now a global effort. It extends from the U.S. Air Force, to schools such as MIT, and universities in Italy, Spain, Portugal, India, K... » read more

Hardware Countermeasures Benchmarking against Fault Attacks


Abstract "The development of differential fault analysis (DFA) techniques and mechanisms to inject faults into cryptographic circuits brings with it the need to use protection mechanisms that guarantee the expected level of security. The AES cipher, as a standard, has been the target of numerous DFA techniques, where its security has been compromised through different formulations and types of... » read more