Chip Industry Technical Paper Roundup: May 28


New technical papers added to Semiconductor Engineering’s library this week. [table id=229 /] More ReadingTechnical Paper Library home » read more

Memory System Benchmarking, Simulation, And Application Profiling Via A Memory Stress Framework


A technical paper titled “A Mess of Memory System Benchmarking, Simulation and Application Profiling” was published by researchers at Barcelona Supercomputing Center, Unversitat Politecnica de Catalunya, and Micron Technology (Italy). Abstract: "The Memory stress (Mess) framework provides a unified view of the memory system benchmarking, simulation and application profiling. The Mess benc... » read more