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Overcoming The Growing Challenge Of Dynamic IR-Drop


IR-drop has always been somewhat of an issue in chip design; voltage decreases as current travels along any path with any resistance. Ohm’s Law is likely the first thing that every electrical engineer learns. But the challenges related to IR-drop (sometimes called voltage drop) have increased considerably in recent years, especially the dynamic IR-drop in the power/ground grid as circuits swi... » read more

Is Common Resistance Affecting Your Analog Design Reliability And Performance?


Integrated circuit (IC) design reliability has always been important and essential to market success. After all, if no one could count on your product to operate as designed, and for as long as intended, there wouldn’t be many buyers! However, given the increase in the types and complexity of design applications, coupled with the increasing technological challenge of manufacturing at advance... » read more

Why Chips Die


Semiconductor devices contain hundreds of millions of transistors operating at extreme temperatures and in hostile environments, so it should come as no surprise that many of these devices fail to operate as expected or have a finite lifetime. Some devices never make it out of the lab and many others die in the fab. It is hoped that most devices released into products will survive until they be... » read more

Designers Face Growing Problems With On-Chip Power Distribution


The technology evolution in semiconductor manufacturing has led to chips with ever-higher power densities, which is leading to serious problems with on-chip power distribution. Specifically, the problems surrounding voltage drop—or IR drop (from V=IxR)—have become so acute that we have seen multiple companies starting to get back dead silicon from the fab. For example, a recent 7nm chip ... » read more

Tech Talk: 7nm Process Variation


Ankur Gupta, director of field applications at ANSYS, discusses process variation and the problems it can cause at 10/7nm and beyond. https://youtu.be/WHNjFr1Da6s » read more

The Implementation Of Embedded PVT Monitoring Subsystems In Today’s Cutting Edge Technologies


This new whitepaper from Moortec takes a comprehensive look at the Implementation of Embedded PVT Monitoring Subsystems in Today’s Cutting Edge Technologies and how this can benefit today’s advanced node semiconductor design engineers by improving the performance and reliability of SoC designs. With advances in CMOS technology, and the scaling of transistor channel lengths to nanometer (nm)... » read more

Managing Voltage Drop At 10/7nm


Power integrity is becoming a bigger problem at 10/7nm because existing tools such as static analysis no longer are sufficient. Power integrity is a function of static and dynamic voltage drop in the power delivery network. And until recently, static analysis did an effective job in measuring the overall robustness of PDN connectivity. As such, it is a proxy for PDN strength. The problem is ... » read more

Closing The Power Integrity Gap


Voltage drop has always been a significant challenge. As far back as 130nm, specialist tools were being used to ensure that enough local decoupling capacitance (decap) cells were inserted in addition to larger decaps implemented around the SoC. But advanced nodes are complicating matters and further increasing complexity. These technological challenges, which underlie the power, performance ... » read more

Accurate Thermal Analysis, Including Thermal Coupling Of On-Chip Hot Interconnect


Driven by rapid advancement in mobile/server computing and automotive/communications, SoCs are experiencing a fast pace of functional integration along with technology scaling. Advanced low power techniques are widely used, while meeting higher performance requirements using a variety of packaging technologies. The Internet of Things (IoT) is further opening up new applications with connected d... » read more

Two Constraints-Based Techniques To Address Power-Related Challenges In SoC Design


Power scheduling, power integrity targets, voltage drop—these are just a few of the power-related challenges you’re no doubt managing in your SoC designs. There aren’t any easy answers, but there are some emerging—and promising—techniques. Two such techniques, according to University of Toronto Professor Farid Najm, are constraints generation and constraints-based verification. “... » read more

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