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Automotive IC Production Wafer Test In A Zero-Defect World


By Amy Leong, FormFactor. Innovations in automotive semiconductor ICs post a high bar for wafer test. FormFactor’s Chief Marketing Officer, Amy Leong, provides insights into the challenges associated with automotive IC production wafer testing amid the requirement for zero-defects. Click here to continue reading. » read more

What’s WAT? An Overview Of WAT/PCM Data


Wafer acceptance testing (WAT) also known as process control monitoring (PCM) data is data generated by the fab at the end of manufacturing and generally made available to the fabless customer for every wafer. The data will typically have between forty and one hundred tests, each test having a result for each site (or “drop-in”) on the wafer. The sites are located so that the fab can monito... » read more

New Test Methods For 5G Wafer High-Volume Production


In order to provide the chips required for this change in the landscape, there will be a large number of changing requirements in wafer test that come out of these architectural requirements. Form Factor partnered with Intel to investigate these changes, and tested one such example of a new test methodology. In a joint collaboration with Intel to develop a test methodology for their 5G RF-So... » read more

Test Setup Optimization And Automation For Accurate Silicon Photonics Wafer Acceptance Production Tests


Implementing energy-efficient optical transceiver modules with silicon photonics (SiPh) and 3DIC technologies will help alleviate the increasing energy consumption for hyperscale data centers. To facilitate effective 3DIC heterogenous integration of these photonics integrated circuits for optical transceivers, high precision, repeatable and reliable SiPh wafer acceptance tests are essential and... » read more