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Automotive IC Production Wafer Test In A Zero-Defect World

Challenges of automotive IC production wafer testing amid the requirement for zero-defects.

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By Amy Leong, FormFactor.

Innovations in automotive semiconductor ICs post a high bar for wafer test. FormFactor’s Chief Marketing Officer, Amy Leong, provides insights into the challenges associated with automotive IC production wafer testing amid the requirement for zero-defects.

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