Reducing in-system test time for long-term reliability and high defect coverage.
Meeting the ISO 26262 requirements for high quality and long-term reliability mans implementing on-chip safety mechanisms with high defect coverage of IC logic. This paper describes Observation Scan Technology, a new new logic built-in-self-test (BIST) technology that improves logic BIST test quality and reduces in-system test time. Empirical results demonstrate 90% test coverage with up to 10X fewer LBIST patterns when compared with previous industry-leading LBIST solutions.
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