The Ever-Increasing Role Of PVT Monitor IP And Its Significance In Silicon Lifecycle Management

The demand for semiconductor chips has grown exponentially over the years, driven by advancements in technologies such as artificial intelligence, the internet of things, 5G, automotive and cloud. With this increased demand, there is a growing need for more reliable semiconductor chips that can operate under extreme conditions and withstand the rigors of modern applications. Here are some of the latest trends in semiconductor chips that are driving this need for more reliability:

• Miniaturization: The trend towards smaller, more compact devices has led to the miniaturization of semiconductor chips. These smaller chips are more susceptible to errors caused by voltage and temperature variations, making reliability a critical factor in their design.
• Higher operating frequencies: As semiconductor chips become faster and more powerful, they operate at higher frequencies, which can cause heat buildup and affect the chip’s performance. Reliable thermal management systems are needed to prevent overheating and maintain optimal performance.
• Increased complexity: The increasing complexity of semiconductor chips has led to more complex manufacturing processes and a higher likelihood of defects. Reliable testing and quality control measures are needed to ensure that chips meet strict performance and reliability standards.
• Harsh environments: Many applications, such as automotive, aerospace, and industrial, require semiconductor chips that can operate reliably in harsh environments, such as high temperatures, humidity, and vibration. The need for reliable chips in these environments has driven the development of new materials, packaging technologies, and testing methods.
• Data security: With the increasing use of semiconductor chips in applications such as financial transactions, personal identification, and data storage, there is a growing need for reliable chips that can protect sensitive information from cyber threats.

Multi-die and 3D IC are two technologies that have emerged in recent years to address the challenges of miniaturization and increased complexity in semiconductor chips. However, these technologies also pose new challenges, such as thermal management, testing, and reliability, which must be addressed in order to ensure their successful deployment.

Silicon lifecycle management enabled by PVT monitor IP is ready for the mainstream

Big data analytics has made inroads in a variety of industries, from science to finance. Now it’s time for the chip industry to turn a trove of information collected from every stage of the device lifecycle into actionable insights beginning from in-design to in-ramp to in-production and finally to the holy grail of it all, in-field when chips are in mission mode. Design teams in market segments such as high-performance computing (HPC) and automotive are well-versed in Silicon Lifecycle Management (SLM). In the HPC space, SLM solutions help designers of data center SoCs meet service level agreement uptimes. For automotive designers, SLM technologies continuously assess factors such as silicon aging and degradation, paving the way to a more predictive approach to maintenance and replacement of in-vehicle electronic systems. However, given an increasing emphasis on reliability, availability, and serviceability (RAS) for mission-critical applications across many other market segments, SLM is poised to become more widely used in the coming years.

With process variability (particularly at advanced nodes), as well as environmental and aging effects, silicon designs are under a great deal of stress. At the same time, they are expected to perform at ever higher levels and, in cases like automotive, last for longer periods of time.

Process detectors, voltage monitors and temperature sensors (PVT) form the building blocks for monitoring these fundamental metrics that allows for complete silicon lifecycle management at every stage of a device from in-design, to in-ramp, to in-production and finally in-field operation.

A great example of the indispensability of in-field monitoring is the ability to extend the lifetime of an HPC server in a data center, home IoT gadget, 5G system, personal mobile devices and automobiles where these chips go into. Cloud data center downtime can be very costly for downstream customers, just as losing utilization to one’s cellphone can be very unpleasant in today’s global age where without access to information and mobile features such as secure payments, boarding passes, tickets etc., life basically comes to a standstill until it is replaced. By utilizing real-time data from PVT Monitors a warning can be issued, and with subsequent on-the fly analytics the system life could be prolonged by taking action to compensate for the adverse effects while a more permanent solution is implemented or suggested to the user ahead of time in a predictive manner. PVT monitors can enable that and prevent unwarranted outcomes ahead of time.

The Process Detector IP is used to determine the process speed that the die or wafer falls into and is useful for binning and sorting during process ramp up and test. Additionally, it is used for monitoring on-chip variation and aging.

Voltage Monitor IPs are responsible for monitoring the voltage levels within the semiconductor chip during its operation. These monitors detect and measure fluctuations in voltage, ensuring that the chip remains within the recommended operating range. Voltage monitors can also provide feedback to the device’s power management system, which can then adjust the voltage levels accordingly to maintain optimal performance.

Temperature Sensor IPs are responsible for monitoring the temperature within the semiconductor chip die. The miniaturization of chips has resulted in a higher power density, which leads to increased heat generation. Temperature sensors detect changes in the chip’s temperature, alerting the device’s thermal management system to initiate cooling measures to prevent overheating. Overheating can cause permanent damage to the chip and affect its performance, resulting in reduced device lifespan or failure.

The significance of process, voltage and temperature (PVT) monitors lies in their ability to ensure the reliable operation of semiconductor chips, as these environmental variations can cause errors in the chip’s operation, leading to decreased performance or complete failure. PVT Monitors can detect these variations, enabling the device’s power and thermal management systems to adjust accordingly and maintain optimal performance. This is critical for devices that operate in harsh environments, such as automotive and aerospace applications and in applications where system downtime is unacceptable, which in today’s connected world is almost everywhere that chips go into.

In conclusion, PVT monitors are essential components in semiconductor chips. They play a critical role in maintaining the chips’ optimal performance and reliability by detecting and measuring process, voltage and temperature variations. As the demand for smaller and more capable electronic devices continues to grow, the importance of these monitors will only continue to increase. The monitor data is used downstream by AI driven analytics engines provided by Synopsys that can be embedded, at the edge, on-premises or cloud based. With devices staying in service much longer and in more places, providing an actionable feedback loop based on learnings from past and current designs that can be implemented in the next generation of products being designed makes them better and more reliable. PVT Monitors close the loop between design and in-field by providing in-silicon visibility and insight that is the key to complete the Silicon Lifecycle Management system that every chip maker is now taking very seriously.

For more information please visit:

• In-Chip PVT Monitoring and Sensing | Synopsys
• Silicon Lifecycle Management (SLM) | Synopsys