“See No Evil” Shouldn’t Apply To SoC Design


In the first part of this blog series, Talking Sense with Moortec…’Are you listening’, I looked at not waiting for hindsight to be wise after the event, instead make use of what’s available and act ahead of time. There’s a Japanese maxim, depicting three ‘wise’ monkeys… Kikazaru, Mizaru, and Iwazaru, better known as ‘hear no evil, see no evil and speak no evil’. If they we... » read more

In-Chip Monitoring Becoming Essential Below 10nm


Rising systemic complexity and more potential interactions in heterogeneous designs is making it much more difficult to ensure a chip, or even a block within a chip, will functioning properly without actually monitoring that behavior in real-time. Continuous and sporadic monitoring have been creeping into designs for the past couple of decades. But it hasn’t always been clear how effective... » read more

Explaining Adaptive Voltage Scaling And Dynamic Voltage Frequency Scaling


A Q&A with Moortec CTO Oliver King. What exactly do we mean by Adaptive Voltage Scaling versus Dynamic Voltage Frequency Scaling? Adaptive Voltage Scaling (AVS) involves the reduction of power by changing the operating conditions within an ASIC in a closed loop. Dynamic Voltage Frequency Scaling (DVFS), on the other hand, is a power management technique where the voltage is increased ... » read more

Supply Monitoring On 28nm & FinFET: The Challenges Posed


A Q&A with Moortec CTO Oliver King. What are the issues with supplies on advanced nodes? The supplies have been coming down, quicker than the threshold voltages which has led to less supply margin. In addition to this, the interconnects are becoming thinner and closer together, which is pushing up resistance and also capacitance. What is the effect of these issues? In short, it... » read more

The Importance Of Embedded In-Chip Monitoring In Advanced Node CMOS Technology


By Oliver King & Ramsay Allen With advances in CMOS technology and the scaling of transistor channel lengths to nanometer (nm) dimensions, the density of digital circuits per unit area of silicon has increased as has the process variability of devices manufactured. The increase in digital logic (or gate) density, which equates to an increase in power density, is a major contributor to... » read more