The Importance Of Embedded In-Chip Monitoring In Advanced Node CMOS Technology

By Oliver King & Ramsay Allen With advances in CMOS technology and the scaling of transistor channel lengths to nanometer (nm) dimensions, the density of digital circuits per unit area of silicon has increased as has the process variability of devices manufactured. The increase in digital logic (or gate) density, which equates to an increase in power density, is a major contributor to... » read more