September 2012 - Page 4 of 6 - Semiconductor Engineering

Testing One, Two, Three
By Ed Sperling - 20 Sep, 2012 - Comments: 0

The sheer number of off-the-shelf parts that are showing up in ICs these days—and that includes both hard and soft parts—means that to a large extent we are designing and manufacturing a series of interconnected black boxes. Black boxes, at least in theory, are a major time saver. The idea that you can put together a series of well-designed, state-of-the-art Lego-like blocks that are pro... » read more

Power And Performance: GSS Sees SOI Advantages For FinFETs
By Various Writers - 17 Sep, 2012 - Comments: 0

Are FinFETs better on SOI? In a series of papers, high-profile blogs and subsequent media coverage,Gold Standard Simulations (aka GSS) has indicated that, yes, FinFETs should indeed be better on SOI. To those of us not deeply involved in the research world, much of this may seem to come out of nowhere.  But there’s a lot of history here, and in this blog we’ll take a look at what it’s... » read more

Power Budgets: Where Is The Low-Hanging Fruit?
By Ed Sperling - 15 Sep, 2012 - Comments: 0

Low-Power Engineering looks for the best ways to cut power for a reasonable cost with Mentor Graphics, Synopsys, Apache Design Solutions, Oasys Design Systems and Xilinx. [youtube vid=Gqoenm00Mso] » read more

The Double Whammy
By Ed Sperling - 13 Sep, 2012 - Comments: 0

By Ann Steffora Mutschler Given that at 40nm and below every [getkc id="81" kc_name="SoC"] has some mixed-signal content, combined with the fact that power awareness is top priority no matter what the target application is, design teams and verification engineers are grappling with tremendous challenges just to get a chip to yield. “For verification engineers and for designers, this is a ... » read more

Keeping The Balance
By Ed Sperling - 13 Sep, 2012 - Comments: 0

By Ann Steffora Mutschler The brains of datacenters today are more powerful than ever due to technology advancements in chip architectures and in manufacturing processes that allow more processing power thanks to Moore’s Law. But knowing exactly how and where to configure the processors and cores for optimum throughput and performance within a certain power budget raises a number of qu... » read more

The Limits Of Virtualization
By Ed Sperling - 13 Sep, 2012 - Comments: 0

By Ed Sperling The future of virtualization in the corporate data center is firmly established, but questions about the value of virtualization beyond that world remain as fuzzy as the future of many-core systems. While there is no theoretical limit to how many cores can be added into SoCs, there is very little progress in developing applications that can take advantage of all of those core... » read more

Blurring The Lines At The OS Level
By Ed Sperling - 13 Sep, 2012 - Comments: 0

By Ed Sperling Picking an operating system—or choosing not to use an operating system—is becoming as complex a decision as choosing which IP to use in an SoC. Even decisions that sound straightforward may have ramifications on the total system power budget or performance, requiring them to be an integral part of the overall architectural process. But the choice of operating systems, as ... » read more

Signal Integrity’s Growing Complexity
By Matt Elmore - 13 Sep, 2012 - Comments: 0

By Matt Elmore While in the market for a memory upgrade recently, I was surprised by the availability of commercial DDR memories. You can get 8GB of DDR3 memory, transferring 17GB/s, relatively inexpensively. The progress in memory design is outstanding. From smartphones to gaming PCs, quick communication between the IC and off-chip memory is key to enabling the performance we demand in the... » read more

Improving Reliability
By Dina Medhat - 13 Sep, 2012 - Comments: 0

By Dina Medhat Advanced IC designs implement complex strategies to minimize static and dynamic power. Mixed-signal designs typically require different supply voltages for the analog and digital portions of the design, and even all-digital ICs can have many power domains and operating voltages. Typically, some signal lines cross from one domain to another and special interfaces and “voltage p... » read more

LP Test Strategies
By Luke Lang - 13 Sep, 2012 - Comments: 0

By Luke Lang Power during test is one area that is often overlooked. In the worst (but easiest to diagnose) case, excessive test power can lead to a smoking chip on the tester. (You don’t need an engineering education to see the problem.) In a better (but more difficult to diagnose) case, excessive test power will cause reduced yield. Let’s look at what causes excessive test power and how ... » read more

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