How reliability analysis needs to change for mission-critical design.
Rapidly increasing electrical content in automobiles is driving the need for revolution in analog integrated circuit (IC) design methodology. Compared to designing for consumer electronics, designing for mission-critical applications—industrial, medical, space, and automotive—requires a different approach to reliability analysis. We will explore how reliability analysis needs to change for mission-critical design. These changes include better modeling of device degradation, accelerating electrical aging with additional phenomena that contribute to shifts in device characteristics, and using realistic use models to better represent the how the devices are used.
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