Automotive, AI Drive Big Changes In Test


Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

Analog Reliability Analysis for Mission-Critical Applications


Rapidly increasing electrical content in automobiles is driving the need for revolution in analog integrated circuit (IC) design methodology. Compared to designing for consumer electronics, designing for mission-critical applications—industrial, medical, space, and automotive—requires a different approach to reliability analysis. We will explore how reliability analysis needs to change for ... » read more