Blog Review: June 12

Synopsys’ Taylor Armerding warns that city and state governments aren’t learning from history when it comes to ransomware, and despite numerous examples of recent attacks are not implementing proper security measures or even keeping systems patched.

Cadence’s Paul McLellan shares highlights from the recent Embedded Vision Summit, including how light can be used at femtosecond intervals to observe some interesting phenomena and efforts to move machine learning to work on tiny microcontrollers.

In a video, Mentor’s Colin Walls digs into write-only ports in embedded systems, the purpose they serve, and how to program them.

Arm’s Charlotte Christopherson points out a talk by Thomas F. Wenisch of the University of Michigan on a project to develop programming models for byte-addressable persistent memory to ensure that system state is recoverable upon failure.

A Rambus writer observes that many companies are finding training AI/ML algorithms more difficult than expected, with 78% of AI/ML projects stalled at some stage before deployment.

ANSYS’ Paolo Colombo takes a look at trends influencing the aerospace and defense industry, from using simulation to make more fuel-efficient aircraft to optimizing maintenance and repairs.

And don’t forget to check out the blogs from the latest IoT, Security & Automotive and Test, Measurement & Analytics newsletters:

Editor In Chief Ed Sperling contends that the AI supply chain needs to develop ways to keep hackers at bay.

Synopsys’ Ravindra Aneja makes the case for data path verification with formal for AI designs.

Flex Logix’s Geoff Tate explains how large images interact with batch sizes to determine memory usage.

ClioSoft’s Ranjit Adhikary observes that cloud vendors now offer more things design teams need, from shared storage to scaling up for peak storage.

Mentor’s Andrew Macleod questions why carmakers want to get into the business of making chips.

Marvell’s Nishant Lodha addresses the broader scope of use cases for open-source software-defined networking.

Editor In Chief Ed Sperling finds test is taking on a whole new high-profile role in design, manufacturing, and post-production analysis.

Mentor’s Ron Press describes a new RTL-based hierarchical DFT flow for subsystems with Arm cores that promises better and more efficient testing.

Delta’s Yavuz Kose explains why non-destructive SAM is an efficient tool for analyzing adhesion between layers and the presence of possible flaws in each layer.