Cache Occupancy Attacks Targeting The SLC of Apple M-Series SoCs (Northeastern Univ.)
By Technical Paper Link - 11 May, 2025 - Comments: 0

A new technical paper titled "EXAM: Exploiting Exclusive System-Level Cache in Apple M-Series SoCs for Enhanced Cache Occupancy Attacks" was published by researchers at Northeastern University. Abstract "Cache occupancy attacks exploit the shared nature of cache hierarchies to infer a victim's activities by monitoring overall cache usage, unlike access-driven cache attacks that focus on spe... » read more

Safety Architecture and Approaches for Automotive SW And HW Including ASIL D And AI/ML (Mercedes-Benz, U. Of Washington)
By Technical Paper Link - 11 May, 2025 - Comments: 0

A new technical paper titled "Key Safety Design Overview in AI-driven Autonomous Vehicles" was published by researchers at Mercedes-Benz Research and Development North America and University of Washington . Abstract "With the increasing presence of autonomous SAE level 3 and level 4, which incorporate artificial intelligence software, along with the complex technical challenges they present... » read more

Chip Industry Week in Review
By The SE Staff - 09 May, 2025 - Comments: 0

Check out the Inside Chips podcast for our behind-the-scenes analysis. The U.S. government is rescinding a Biden-era AI export rule that would have imposed complex restrictions on how U.S. chip and AI technology is sold abroad, a move welcomed by companies like Nvidia, reports Bloomberg. While new, simpler guidelines are expected in the coming months, the decision introduces short-term uncer... » read more

Overlay, Critical Dimension, And Z-Height Metrology Solutions For Advanced Packaging
By Al Gamble - 08 May, 2025 - Comments: 0

The consumer’s thirst for AI-based applications is powering the ever-evolving electronics industry. Applications delivering higher levels of information in human language-like form, smarter at-home gadgets, the ability to receive a medical diagnosis without a doctor’s visit and the convenience of autonomous vehicles are among the applications powering this thirst. To better enable these app... » read more

AI For Test: The New Frontier
By Christophe Begue - 08 May, 2025 - Comments: 0

Dr. Ming Zhang, PDF Solutions vice president of Fabless Solutions, delivered the keynote at the TestConX 2025 conference in March. As he began his presentation, Ming borrowed the “learn, explore and share” line from Ira Feldman, the organizer of the conference, to set the tone of his talk. He promised to share what he and PDF Solutions learned and what’s useful and what’s not useful as ... » read more

Better ATPG To Minimize Chip Test Time And Cost
By Hari Mani - 08 May, 2025 - Comments: 0

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, simulated, laid out, and checked in about the same time with the same effort, despite the growth in die size and density. One area of particular focus is manufacturing test. Any effort expended to reduce t... » read more

Shifting Left With DFT To Optimize Productivity, Testability, And Time-To-Market
By Siemens EDA - 08 May, 2025 - Comments: 0

This paper discusses one of the Siemens EDA shift-left strategies in the RTL-to-signoff flow: shift-left design-for-test (DFT). Tessent RTL Pro software automates the analysis and insertion of Tessent VersaPoint test point technology, LBIST-OST test points, dedicated scan wrapper cells and x-bounding logic as behavioral code at the RTL level. Tessent RTL Pro builds on Tessent’s market-leading... » read more

Identifying Sources Of Silent Data Corruption
By Laura Peters - 08 May, 2025 - Comments: 0

Silent data errors are raising concerns in large data centers, where they can propagate through systems and wreak havoc on long-duration programs like AI training runs. SDEs, also called silent data corruption, are technically rare. But with many thousands of servers, which contain millions of processors running at high utilization rates, these damaging events become common in large fleets. ... » read more

IoT Security By Design
By Lee Harrison - 08 May, 2025 - Comments: 0

After years of anticipation and steady uptake, the Internet of Things (IoT) seems poised to cross over into mainstream business use. The percentage of businesses utilizing IoT technologies has risen from 13% in 2014 to approximately 25% today. Global projections indicate that the number of IoT-connected devices is expected to reach 43 billion by 2030, nearly tripling from the figures in 2018. O... » read more

Coaxial Test Sockets Are In The Critical Path Of Advanced AI/CPU Products
By Jack Lewis - 08 May, 2025 - Comments: 0

Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and advanced packaging manufacturing process. Yield loss at this point in the process is catastrophic to the bottom line. We at Modus Test, working in conjunction with our customers, have seen first-h... » read more

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