RISC-V Conformance


Experts At The Table: Despite growing excitement and participation in the development of the RISC-V ecosystem, significant holes remain in the development flow. One of the most concerning is conformance, which must exist before software portability becomes possible. Semiconductor Engineering discussed the issue with John Min, vice president of customer service at Arteris; Zdeněk Přikryl, CTO... » read more

Mastering Cyber Awareness: Training For The Digital Battlefield


In today’s digital battlefield, cyber awareness is crucial for warfighters. To effectively prepare them, it’s essential to create realistic and detailed models of mobile networks, encompassing both physical and virtual infrastructure. This is where network modeling software comes into play, offering a high-fidelity approach to enhance cyber situational awareness. A high-fidelity modeling an... » read more

Accelerate AI SoC Designs with NoC Tiling


Network-on-chip (NoC) tiling technology is revolutionizing AI and machine learning-enabled semiconductor designs. This emerging approach uses proven, robust network-on-chipIP to facilitate scaling, condense design time, speed testing and reduce design risk. It allowsSoC architects to create modular, scalable designs by replicating soft tiles across the chip. Each soft tile represents a self-con... » read more

Blog Review: Oct. 30


Synopsys' Frank Schirrmeister argues that hardware-assisted verification techniques like emulation and prototyping are essential to help engineers improve design behavior to manage complexity and ensure systems function seamlessly in real-world applications. Siemens’ Stephen V. Chavez finds that ultra high-density interconnect (UHDI) has changed the design and production of PCBs to enable ... » read more

2D Semiconductors Make Progress, But So Does Silicon


Semiconductor industry researchers have been anticipating the need for better transistor channel materials to replace silicon for a long time, but silicon devices have continued to improve enough to postpone that change. Silicon continues to provide an unmatched combination of device performance, manufacturability, and cost effectiveness. In recent years, though, the “end of silicon” cha... » read more

Early Architecture Performance and Power Analysis of Multi-Die Designs


Despite the clear advantages of multi-die designs, there are numerous new challenges that stand in the way of multi-die design realization. This white paper focuses on those challenges that can be addressed by early architecture exploration of multi-die designs, including: -System pathfinding -Memory utilization and coherency -Power/thermal management Find out how to overcome such chall... » read more

Four Real-World Applications for Electromagnetic Simulation


With the complexity of integrated circuit (IC) components increasing, electromagnetic (EM) circuit simulation is now critical for accurate and efficient design. The EM effects on a circuit can drastically alter voltage levels and damage semiconductor devices. With EM simulation, designers can account for EM effects on their circuit to avoid costly problems before they happen. EM simulation e... » read more

The Impact of Magnetic Fields On STT-MRAM Operations


A technical paper titled "Impact of external magnetic fields on STT-MRAM" was recently published by researchers at Univ. Grenoble Alpes, Everspin, GlobalFoundries, imec, et al. Abstract "This application note discusses the working principle of spin-transfer torque magnetoresistive random access memory (STT-MRAM) and the impact that magnetic fields can have on STT-MRAM operation. Sources of... » read more

Recent Progress in Inorganic Metal-Oxide-Based Photoresists For EUVL


A technical paper titled "Recent Advances in Metal-Oxide-Based Photoresists for EUV Lithography" was published by researchers at University of South–Eastern Norway. Abstract: "Extreme ultraviolet lithography (EUVL) is a leading technology in semiconductor manufacturing, enabling the creation of high-resolution patterns essential for advanced microelectronics. This review highlights recent... » read more

FPGA Fault Injection Attacks (ASU, KIT)


A new technical paper titled "Hacking the Fabric: Targeting Partial Reconfiguration for Fault Injection in FPGA Fabrics" was published by researchers at Arizona State University and Karlsruhe Institute of Technology (KIT). Abstract "FPGAs are now ubiquitous in cloud computing infrastructures and reconfigurable system-on-chip, particularly for AI acceleration. Major cloud service providers s... » read more

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