category: Blogs – PTES

category: IoT, Security & Automotive

Signal Connectivity Checks Are Not Just For Design-For-Test Teams
By Pawini Mahajan - 08 Jun, 2021 - Comments: 0

By Pawini Mahajan and Raja Koneru The complexity with system-on-chip (SoC) design continues to grow, creating greater complexity of the corresponding design-for-test (DFT) logic required for manufacturing tests. Design teams are challenged not only by high gate counts and the array of internally developed and third-party IP integrated into their designs: the need to achieve high-quality manu... » read more

Hybrid System-Level Test For RF SiP
By Koji Miyauchi - 08 Jun, 2021 - Comments: 0

In recent years, the proliferation of the IoT has focused attention on low-power-wireless applications. IoT modules incorporating functions such as Bluetooth Low Energy (BLE) transceivers, MCUs, and power-management circuitry are becoming system-in-package (SiP) and even one-chip devices. Such devices increase the demand for a mass-production test environment that can measure them in a short ti... » read more

Understanding Optical Inspection For CIS
By Woo Young Han - 11 May, 2021 - Comments: 0

The demand for smartphone cameras, video conferencing, surveillance and autonomous driving has fueled explosive growth of CMOS image sensor (CIS) manufacturing in the last decade. While CIS becomes an increasingly important element in the production of today’s consumer electronics, there are unique challenges in production that must be addressed. As pixel sizes shrink, we see an inverse relat... » read more

In-Chip Sensing And PVT Monitoring: Not Just An Insurance Policy
By Ramsay Allen - 11 May, 2021 - Comments: 0

You wouldn’t drive an expensive car without insurance or take a flight in an aircraft without performing instrument and control surface checks. So why would you take the risk of designing a multi-million dollar advanced node semiconductor device without making sure you are aware of, and able to manage, the dynamic conditions that had the potential to make or break a silicon product? Advanced... » read more

Testing AiP Modules In High-Volume Production
By Jose Moreira - 11 May, 2021 - Comments: 0

Far-field and radiating near-field are two options for high-volume over-the-air (OTA) testing of antenna-in-package (AiP) modules with automated test equipment (ATE) [1]. In this article, we define an AiP device under test (DUT) and examine the measurement results from both methods. Creating an AiP evaluation vehicle Proper evaluation of an ATE OTA measurement setup requires an AiP module. Us... » read more

Cryostats Enable Astrophysics Research
By Paul Owen - 11 May, 2021 - Comments: 0

Imagine designing and building two prototype HPD cryostats for the Submillimeter Array on Maunakea in Hawaii. The SMA is a collaborative project between the Smithsonian Astrophysical Observatory (SAO, a member of the Center for Astrophysics | Harvard & Smithsonian) and the Academia Sinica Institute of Astronomy and Astrophysics. The SMA consists of eight radio telescopes operating fro... » read more

Debug And Traceability Of MCMs And Chiplets In The Manufacturing Test Process
By Guy Cortez - 16 Apr, 2021 - Comments: 0

Single die packages and products have been the norm for decades. Moreover, so has multi-chip modules (MCMs) or system in package (SiP) for quite some time. Understandably, with ASICs and SoCs becoming larger while silicon geometries continue to get smaller, there is an opportunity to combine even more functionality into a smaller form factor for the end product. Hence, new advancements in desig... » read more

How Do Machines Learn?
By Weiyang (Will) Zhou - 06 Apr, 2021 - Comments: 0

We depend, or hope to depend, on machines, especially computers, to do many things, from organizing our photos to parking our cars. Machines are becoming less and less "mechanical" and more and more "intelligent." Machine learning has become a familiar phrase to many people in advanced manufacturing. The next natural question people may ask is: How do machines learn? Recognizing diverse obje... » read more

Security For Cars That Are Smartphones On Wheels
By Taylor Amerding - 06 Apr, 2021 - Comments: 1

Your modern car is a computer on wheels—potentially hundreds of computers on a set of wheels. Heck, even the wheels are infested with computers—what do you think prompts that little light on your dashboard to come on if your tire pressure is low? And computers don’t just run your infotainment system, backup camera, dashboard warning lights, and the voice that tells you to buckle your seat... » read more

ATE In The Age Of Convergence And Exascale Computing
By Matthias Stahl - 06 Apr, 2021 - Comments: 0

We are currently in the midst of the age of convergence – that is, the convergence of data from a range of applications and data sources. These sources constitute anything that creates data – ranging from human-created data, such as voice and video, through automotive, mobile, and wireless/IoT devices. This also includes edge computing and servers storing the massive amounts of data needed ... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2025 SMG   |  Terms of Service  |  Privacy Policy