category: Blogs – PTES

category: IoT, Security & Automotive

Are You Ready For HBM4? A Silicon Lifecycle Management (SLM) Perspective
By Faisal Goriawalla - 06 Aug, 2024 - Comments: 0

Many factors are driving system-on-chip (SoC) developers to adopt multi-die technology, in which multiple dies are stacked in a three-dimensional (3D) configuration. Multi-die systems may make power and thermal issues more complex, and they have required major innovations in electronic design automation (EDA) implementation and test tools. These challenges are more than offset by the advantages... » read more

Semiconductor Shifts In Automotive: Impact Of EV And ADAS Trends
By Fisher Zhang - 06 Aug, 2024 - Comments: 0

The integration of advanced driver assistance systems (ADAS) and the transition towards electric vehicles (EVs) are significantly transforming the automotive industry. Modern vehicles, essentially computers on wheels, require substantially more semiconductors. In response, carmakers are forming stronger partnerships with semiconductor vendors – some are taking a page from tech giants like ... » read more

Leveraging AI To Efficiently Test AI Chips
By Ira Leventhal - 06 Aug, 2024 - Comments: 0

In the fast-paced world of technology, where innovation and efficiency are paramount, integrating artificial intelligence (AI) and machine learning (ML) into the semiconductor testing ecosystem has become of critical importance due to ongoing challenges with accuracy and reliability. AI and ML algorithms are used to identify patterns and anomalies that might not be discovered by human testers o... » read more

The Semiconductor Revolution And The Role Of Adaptable Testing
By Juan Valdivia - 09 Jul, 2024 - Comments: 0

The semiconductor industry, the backbone of modern technology, is experiencing a rapid evolution driven by the increasing demands for higher performance, greater functionality, and lower power consumption. This evolution is creating new challenges and opportunities in the testing of mixed signal and RF semiconductors and electronics devices, making the need for adaptable and flexible test syste... » read more

Reducing Design Margins With Silicon Model Calibration
By Guy Cortez - 09 Jul, 2024 - Comments: 0

By Guy Cortez and Mark Laird It’s no secret to anyone that chip design gets harder every year. There are two major trends driving these ever-increasing challenges. The first is the continual scaling down to smaller design nodes. Although the pace of new node introduction has slowed somewhat in recent years, the impact of each new geometry and process is more dramatic than ever before. Acce... » read more

Automotive Semiconductors Require Integrated Test Solution
By Toni Dircherl - 09 Jul, 2024 - Comments: 0

The automotive semiconductor test market is experiencing organic growth as chipmakers produce higher volumes of devices serving an array of automotive applications. In addition, the range of applications for automotive-grade semiconductors is evolving as the technology advances. Manufacturers of automated test equipment (ATE) are adapting to ensure their systems can handle devices ranging from ... » read more

Achieving Zero Defect Manufacturing Part 1: Detect & Classify
By Prasad Bachiraju - 11 Jun, 2024 - Comments: 0

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs collect and how they utilize that data. While chip makers are accumulating petabytes of data across the entire semiconductor process, a question arises: how much of that information is being fully uti... » read more

Automotive Electronics Reliability Requires In-Field Silicon Monitoring
By Lorin Kennedy - 11 Jun, 2024 - Comments: 1

By Lorin Kennedy and Dan Alexandrescu For everyday consumers, no products require reliability more than automobiles. While consumers may be willing accept their laptops and phones limiting performance or abruptly turning off when systems reach unacceptable temperature levels, that is not the case for the reliability of Advanced Driver-Assistance Systems (ADAS) or other safety critical system... » read more

Unlocking Efficiency: Tackling The Hidden Costs Of Setting Up Test
By Juan Valdivia - 11 Jun, 2024 - Comments: 0

In the rapidly evolving landscape of technology and manufacturing, the efficiency and effectiveness of automated test systems can significantly impact a company's bottom line. Have you considered where the bulk of these costs come from? While the complexities involved in developing, deploying, and maintaining these systems often pose substantial challenges, they also present immense opportuniti... » read more

Semiconductor Testing Unlocks Increasing Levels Of ADAS
By Fisher Zhang - 11 Jun, 2024 - Comments: 0

Today’s advanced driver assistance systems (ADAS) require unprecedented computing power – tasked with processing an incredible amount of data from sensors in real-time, making split-second decisions, and ensuring the safety and comfort of passengers. The challenge is fluid and, as vehicles ascend from one level of autonomous driving to the next, computational demands will rise exponentially... » read more

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