category: Blogs – PTES

category: IoT, Security & Automotive

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules
By Sri Ganta - 08 Feb, 2024 - Comments: 0

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis, and corresponding decision making that are otherwise limited by human abilities. Therefore, complex challenges in semiconductor design, test and manufacturing are a perfect match for AI. The... » read more

FTIR On Earth, Mercury In Focus
By Xia Stammer - 08 Feb, 2024 - Comments: 0

On early hours on 19th October 2018 at Guiana Space Centre in Kourou in French Guiana an Ariane 5 rocket successfully launched the BepiColombo mission. It started its 7 years journey to Mercury. The joined mission of the European Space Agency (ESA) and the Japan Aerospace Exploration Agency (JAXA) was named in honor of Giuseppe “Bepi” Colombo, an Italian scientist who studied Mercury and fi... » read more

Partnership To Improve Semiconductor Quality And Yield
By Eli Roth - 08 Feb, 2024 - Comments: 0

By Eran Rousseau (NI) and Eli Roth (Teradyne) The semiconductor industry is notorious for its high production costs and the critical importance of maintaining impeccable product quality. As technology advances and consumer expectations rise, semiconductor companies face constant pressure to meet these cost and quality goals while also delivering cutting-edge products. Traditionally, the s... » read more

Using FTIR To Improve SiC Power Device Performance
By Nick Keller - 09 Jan, 2024 - Comments: 0

The figures alone are impressive: SiC power devices are experiencing an annual average growth rate approaching 34% through 2027, according to the Yole Group. However, the potential for this amongst other compound semiconductor-based power devices such as gallium nitride (GaN) to change the world around us is even more impressive. Thanks to the role that SiC-based devices play in the increase... » read more

SLM Analytics Of In-Chip Monitor Data Unlock Greater Productivity And Cost Savings
By Guy Cortez - 09 Jan, 2024 - Comments: 0

When it comes to measuring key operational metrics such as power and performance of your silicon, in-chip monitors have been the longstanding cornerstone for providing such valuable measurements and insights. Data captured from these monitors – process monitors configured in the form of ring oscillator chains being the most common – can tell you if your chip is meeting the requisite power o... » read more

Wireless Trend Predictions For 2024 And Their Impact On The Test And Measurement Industry
By Niklas Nolemo - 09 Jan, 2024 - Comments: 0

The ever-evolving landscape of wireless technology continues to shape how we connect, communicate, and innovate. Connected systems continue to grow in complexity and reliance on one another which will impact the test & measurement industry significantly.  As we step into the year 2024, several key wireless trends are set to dominate the industry, ushering in a new era of connectivity and r... » read more

Meeting The Test Challenges Of Ultra-Wideband Chipsets
By Kevin Yan - 09 Jan, 2024 - Comments: 0

By Kevin Yan and Daniel Sun This article is adapted from a paper and presentation at SEMICON China, March 2023. Ultra-wideband (UWB) technology, as defined by IEEE 802.15.4 and 802.15.4z standards, enables short-range, low-power RF location-based services and wireless communication. A variety of devices have reached the market to help implement UWB capability, but these devices present si... » read more

Empowering Universities By Retaining Raman Knowledge
By Inga Koehler - 09 Jan, 2024 - Comments: 0

A big chunk of precious research funds spent on an expensive piece of equipment, for example a Raman microscope. Now, such a magnificent piece of hardware can seem quite intimidating. After all, it could be capable of building a spaceship! Now a poor graduate student must face copious amounts of training, becoming a real expert over the span of 3 to 4 years. Mostly because the professor ... » read more

A Bare Wafer Mystery: Inspecting For Back, Edge, And Notch Defects In Advanced Nodes
By Burhan Ali - 12 Dec, 2023 - Comments: 0

It is no mystery that the semiconductor industry is always advancing, with specifications becoming increasingly stringent as defects become increasingly more difficult to discover. This is especially true in the case of the most advanced nodes, where ever-smaller flaws and deformities can result in a killer defect. To solve this More than Moore mystery, you do not need to employ the detectiv... » read more

Unleashing The Power Of Test Through Data
By James Guilmart - 12 Dec, 2023 - Comments: 0

In the relentless pursuit of technological innovation, test engineers find themselves facing ever-increasing pressures to deliver flawless products at an unprecedented pace. From the rapid evolution of autonomous vehicles to the advent of 5G and beyond, the demands on engineering teams continue escalating. While organizations strive to optimize their testing processes, the need for efficient te... » read more

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